{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,5,17]],"date-time":"2025-05-17T05:11:15Z","timestamp":1747458675558},"reference-count":28,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2012,3]]},"DOI":"10.1109\/date.2012.6176474","type":"proceedings-article","created":{"date-parts":[[2013,2,19]],"date-time":"2013-02-19T13:16:29Z","timestamp":1361279789000},"page":"264-267","source":"Crossref","is-referenced-by-count":1,"title":["A case study on the application of real phase-change RAM to main memory subsystem"],"prefix":"10.1109","author":[{"family":"Suknam Kwon","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Dongki Kim","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Youngsik Kim","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Sungjoo Yoo","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Sunggu Lee","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"19","doi-asserted-by":"publisher","DOI":"10.1145\/1669112.1669117"},{"key":"17","doi-asserted-by":"publisher","DOI":"10.1109\/ISIT.2009.5205976"},{"key":"18","article-title":"A 90nm 4Mb Embedded Phase-Change Memory with 1.2V 12ns Read Access Time and 1MB\/s Write Throughput","author":"sandre","year":"0","journal-title":"Proc ISSCC 2010"},{"key":"15","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2007.377981"},{"key":"16","article-title":"Flit-N-Write: A Simple Deterministic Technique to Improve PRAM Write Performance, Energy and Endurance","author":"cho","year":"0","journal-title":"Proc MICRO 2009"},{"key":"13","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2006.888752"},{"key":"14","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2007.908001"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1145\/1669112.1669116"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1145\/2024724.2024738"},{"key":"21","doi-asserted-by":"publisher","DOI":"10.1145\/1736020.1736023"},{"key":"20","doi-asserted-by":"publisher","DOI":"10.1145\/1815961.1816014"},{"key":"22","doi-asserted-by":"publisher","DOI":"10.1145\/1815961.1815980"},{"key":"23","doi-asserted-by":"publisher","DOI":"10.1109\/MICRO.2010.46"},{"key":"24","article-title":"Onyx: A Protoype Phase Change Memory Storage Array","author":"akel","year":"0","journal-title":"Proc HotStorage 2011"},{"journal-title":"JEDEC Standard","article-title":"Low Power Double Data Rate 2 (LPDDR2)","year":"2011","key":"25"},{"key":"26","doi-asserted-by":"publisher","DOI":"10.1145\/1669112.1669172"},{"key":"27","doi-asserted-by":"publisher","DOI":"10.1145\/1065010.1065034"},{"journal-title":"Calculating Memory System Power for DDR2","year":"0","key":"28"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2011.5746415"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2010.5433916"},{"key":"10","doi-asserted-by":"crossref","first-page":"664","DOI":"10.1145\/1629911.1630086","article-title":"pdram: a hybrid pram and dram main memory system","author":"dhiman","year":"2009","journal-title":"2009 46th ACM\/IEEE Design Automation Conference dac"},{"year":"0","key":"1"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1145\/1555754.1555760"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1145\/1555754.1555758"},{"journal-title":"Phase Change Memory (PCM) A New Memory Technology to Enable New Memory Usage Models","year":"0","key":"5"},{"journal-title":"Samsung to Ship MCP with Phase-change","year":"0","key":"4"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1145\/1555754.1555759"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/HPCA.2010.5416645"}],"event":{"name":"2012 Design, Automation & Test in Europe Conference & Exhibition (DATE 2012)","start":{"date-parts":[[2012,3,12]]},"location":"Dresden","end":{"date-parts":[[2012,3,16]]}},"container-title":["2012 Design, Automation & Test in Europe Conference & Exhibition (DATE)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/6171057\/6176405\/06176474.pdf?arnumber=6176474","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,21]],"date-time":"2017-06-21T03:48:07Z","timestamp":1498016887000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6176474\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2012,3]]},"references-count":28,"URL":"https:\/\/doi.org\/10.1109\/date.2012.6176474","relation":{},"subject":[],"published":{"date-parts":[[2012,3]]}}}