{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,5,21]],"date-time":"2025-05-21T06:12:40Z","timestamp":1747807960063,"version":"3.28.0"},"reference-count":16,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2012,3]]},"DOI":"10.1109\/date.2012.6176526","type":"proceedings-article","created":{"date-parts":[[2013,2,19]],"date-time":"2013-02-19T18:16:29Z","timestamp":1361297789000},"page":"532-537","source":"Crossref","is-referenced-by-count":3,"title":["Impact of resistive-open defects on the heat current of TAS-MRAM architectures"],"prefix":"10.1109","author":[{"given":"J.","family":"Azevedo","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"A.","family":"Virazel","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"A.","family":"Bosio","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"L.","family":"Dilillo","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"P.","family":"Girard","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"A.","family":"Todri","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"G.","family":"Prenat","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"J.","family":"Alvarez-Herault","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"K.","family":"Mackay","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"15","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1998.743133"},{"key":"16","doi-asserted-by":"publisher","DOI":"10.1109\/VTEST.2000.843856"},{"key":"13","doi-asserted-by":"crossref","DOI":"10.1016\/0304-8853(96)00062-5","article-title":"Current-driven excitation of magnetic multilayers","volume":"159","author":"slonczewski","year":"1996","journal-title":"Journal of Magnetism and Magnetic Materials"},{"journal-title":"SPECTRE","year":"2008","key":"14"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1063\/1.3259373"},{"journal-title":"Compact Modeling of Magnetic Tunnel Junctions and Design of Hybrid CMOS\/Magnetic Integrated Circuits","year":"2010","author":"guo","key":"12"},{"journal-title":"International Technology Roadmap for Semiconductors (ITRS)","year":"2010","key":"3"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevB.39.4828"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevLett.61.2472"},{"year":"2003","author":"savchenko","key":"10"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1017\/CBO9780511676208"},{"key":"6","first-page":"124","article-title":"MRAM Defect Analysis and Fault Modeling","author":"su","year":"2004","journal-title":"International Test Conf"},{"key":"5","first-page":"277","article-title":"Testing MRAM for Write Disturbance Fault","author":"su","year":"2006","journal-title":"International Test Conference"},{"journal-title":"Evaluation Validation and Design of Hybrid CMOS - Non-volatile Emerging Technology Cells for Dynamically Reconfigurable Fine Grain Architecture","year":"2007","author":"bruchon","key":"4"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1147\/rd.501.0025"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1088\/0143-0807\/29\/3\/008"}],"event":{"name":"2012 Design, Automation & Test in Europe Conference & Exhibition (DATE 2012)","start":{"date-parts":[[2012,3,12]]},"location":"Dresden","end":{"date-parts":[[2012,3,16]]}},"container-title":["2012 Design, Automation & Test in Europe Conference & Exhibition (DATE)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/6171057\/6176405\/06176526.pdf?arnumber=6176526","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,21]],"date-time":"2017-06-21T07:48:04Z","timestamp":1498031284000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6176526\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2012,3]]},"references-count":16,"URL":"https:\/\/doi.org\/10.1109\/date.2012.6176526","relation":{},"subject":[],"published":{"date-parts":[[2012,3]]}}}