{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T13:30:32Z","timestamp":1725456632105},"reference-count":9,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2012,3]]},"DOI":"10.1109\/date.2012.6176531","type":"proceedings-article","created":{"date-parts":[[2013,2,19]],"date-time":"2013-02-19T18:16:29Z","timestamp":1361297789000},"page":"558-561","source":"Crossref","is-referenced-by-count":0,"title":["A scan pattern debugger for partial scan industrial designs"],"prefix":"10.1109","author":[{"given":"K.","family":"Chandrasekar","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"S. K.","family":"Misra","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"S.","family":"Sengupta","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"M. S.","family":"Hsiao","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"doi-asserted-by":"publisher","key":"3","DOI":"10.1109\/DAC.1990.114905"},{"doi-asserted-by":"publisher","key":"2","DOI":"10.1109\/ATS.2008.45"},{"doi-asserted-by":"publisher","key":"1","DOI":"10.1109\/VTEST.2004.1299231"},{"year":"2006","author":"gizopoulos","journal-title":"Advances in Electronic Testing Challenges and Methodologies","key":"7"},{"doi-asserted-by":"publisher","key":"6","DOI":"10.1109\/43.3140"},{"doi-asserted-by":"publisher","key":"5","DOI":"10.1109\/TEST.2008.4700566"},{"doi-asserted-by":"publisher","key":"4","DOI":"10.1109\/ICCAD.1997.643607"},{"doi-asserted-by":"publisher","key":"9","DOI":"10.1109\/VTS.2011.5783736"},{"doi-asserted-by":"publisher","key":"8","DOI":"10.1109\/54.902819"}],"event":{"name":"2012 Design, Automation & Test in Europe Conference & Exhibition (DATE 2012)","start":{"date-parts":[[2012,3,12]]},"location":"Dresden","end":{"date-parts":[[2012,3,16]]}},"container-title":["2012 Design, Automation & Test in Europe Conference & Exhibition (DATE)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/6171057\/6176405\/06176531.pdf?arnumber=6176531","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,21]],"date-time":"2017-03-21T19:14:39Z","timestamp":1490123679000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6176531\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2012,3]]},"references-count":9,"URL":"https:\/\/doi.org\/10.1109\/date.2012.6176531","relation":{},"subject":[],"published":{"date-parts":[[2012,3]]}}}