{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T01:09:56Z","timestamp":1725498596605},"reference-count":12,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2012,3]]},"DOI":"10.1109\/date.2012.6176583","type":"proceedings-article","created":{"date-parts":[[2013,2,19]],"date-time":"2013-02-19T18:16:29Z","timestamp":1361297789000},"page":"1409-1412","source":"Crossref","is-referenced-by-count":0,"title":["Efficient variation-aware EM-semiconductor coupled solver for the TSV structures in 3D IC"],"prefix":"10.1109","author":[{"family":"Yuanzhe Xu","sequence":"first","affiliation":[]},{"family":"Wenjian Yu","sequence":"additional","affiliation":[]},{"family":"Quan Chen","sequence":"additional","affiliation":[]},{"family":"Lijun Jiang","sequence":"additional","affiliation":[]},{"family":"Ngai Wong","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/ASPDAC.2011.5722272"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1145\/1629911.1630110"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2007.364515"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4419-0962-6"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/43.924828"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/SISPAD.2009.5290243"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2009.2030408"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1145\/1629911.1630108"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2011.5938200"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/43.998625"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2010.2103270"},{"year":"0","key":"12"}],"event":{"name":"2012 Design, Automation & Test in Europe Conference & Exhibition (DATE 2012)","start":{"date-parts":[[2012,3,12]]},"location":"Dresden","end":{"date-parts":[[2012,3,16]]}},"container-title":["2012 Design, Automation & Test in Europe Conference & Exhibition (DATE)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/6171057\/6176405\/06176583.pdf?arnumber=6176583","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,21]],"date-time":"2017-03-21T19:26:39Z","timestamp":1490124399000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6176583\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2012,3]]},"references-count":12,"URL":"https:\/\/doi.org\/10.1109\/date.2012.6176583","relation":{},"subject":[],"published":{"date-parts":[[2012,3]]}}}