{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,4,29]],"date-time":"2025-04-29T16:33:44Z","timestamp":1745944424794},"reference-count":17,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2012,3]]},"DOI":"10.1109\/date.2012.6176628","type":"proceedings-article","created":{"date-parts":[[2013,2,19]],"date-time":"2013-02-19T18:16:29Z","timestamp":1361297789000},"page":"917-922","source":"Crossref","is-referenced-by-count":1,"title":["Transistor-level gate model based statistical timing analysis considering correlations"],"prefix":"10.1109","author":[{"family":"Qin Tang","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"A.","family":"Zjajo","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"M.","family":"Berkelaar","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"N.","family":"van der Meijs","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"journal-title":"Nangate 45nm open cell library","year":"0","key":"17"},{"journal-title":"TERRAIN Analysis Principlea Ans Applications","year":"2002","author":"wilson","key":"15"},{"journal-title":"Multivariate Statistical Methods","year":"1976","author":"morrison","key":"16"},{"key":"13","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2005.1560174"},{"journal-title":"Random Diffrential Equations in Science and Engineering","year":"1973","author":"soong","key":"14"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1145\/1837274.1837473"},{"key":"12","first-page":"1","article-title":"Statistical delay calculation with multiple input simultaneous switching","author":"tang","year":"2011","journal-title":"ICICDT"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1145\/1146909.1146975"},{"journal-title":"CCS Timing White Paper","year":"0","key":"2"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1145\/266021.266132"},{"key":"10","first-page":"1","article-title":"Transistor level waveform evaluation for timing analysis","author":"tang","year":"2010","journal-title":"VARI"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1145\/1146909.1146974"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2007.84"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/BMAS.2006.283464"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1145\/1391469.1391526"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1145\/1391469.1391588"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2000.896496"}],"event":{"name":"2012 Design, Automation & Test in Europe Conference & Exhibition (DATE 2012)","start":{"date-parts":[[2012,3,12]]},"location":"Dresden","end":{"date-parts":[[2012,3,16]]}},"container-title":["2012 Design, Automation & Test in Europe Conference & Exhibition (DATE)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/6171057\/6176405\/06176628.pdf?arnumber=6176628","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,21]],"date-time":"2017-03-21T19:13:50Z","timestamp":1490123630000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6176628\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2012,3]]},"references-count":17,"URL":"https:\/\/doi.org\/10.1109\/date.2012.6176628","relation":{},"subject":[],"published":{"date-parts":[[2012,3]]}}}