{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,2,14]],"date-time":"2026-02-14T10:03:04Z","timestamp":1771063384344,"version":"3.50.1"},"reference-count":13,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2012,3]]},"DOI":"10.1109\/date.2012.6176660","type":"proceedings-article","created":{"date-parts":[[2013,2,19]],"date-time":"2013-02-19T18:16:29Z","timestamp":1361297789000},"page":"1106-1109","source":"Crossref","is-referenced-by-count":18,"title":["CrashTest'ing SWAT: Accurate, gate-level evaluation of symptom-based resiliency solutions"],"prefix":"10.1109","author":[{"given":"A.","family":"Pellegrini","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"R.","family":"Smolinski","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"L.","family":"Chen","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"X.","family":"Fu","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"S. K. S.","family":"Hari","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"J.","family":"Jiang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"S. V.","family":"Adve","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"T.","family":"Austin","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"V.","family":"Bertacco","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"13","doi-asserted-by":"publisher","DOI":"10.1109\/TDSC.2006.40"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1109\/ICCD.2008.4751886"},{"key":"12","year":"2005","journal-title":"OpenSPARC T1"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/PACT.2007.4336201"},{"key":"2","first-page":"2147","article-title":"FPGA-Based Fault Injection Techniques for Fast Evaluation of Fault Tolerance in VLSI Circuits","author":"civera","year":"2001","journal-title":"Lecture Notes in Computer Science"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/MM.2005.110"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/EDCC.2006.9"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/DSN.2009.5270291"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/HPCA.2009.4798242"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1145\/1346281.1346315"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/L-CA.2002.8"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1145\/2000064.2000089"},{"key":"8","article-title":"An Architectural Framework for Detecting Process Hangs\/Crashes","author":"nakka","year":"0","journal-title":"Proc EDCC 2005"}],"event":{"name":"2012 Design, Automation & Test in Europe Conference & Exhibition (DATE 2012)","location":"Dresden","start":{"date-parts":[[2012,3,12]]},"end":{"date-parts":[[2012,3,16]]}},"container-title":["2012 Design, Automation & Test in Europe Conference & Exhibition (DATE)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/6171057\/6176405\/06176660.pdf?arnumber=6176660","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,21]],"date-time":"2017-03-21T19:42:39Z","timestamp":1490125359000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6176660\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2012,3]]},"references-count":13,"URL":"https:\/\/doi.org\/10.1109\/date.2012.6176660","relation":{},"subject":[],"published":{"date-parts":[[2012,3]]}}}