{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,23]],"date-time":"2024-10-23T07:28:33Z","timestamp":1729668513621,"version":"3.28.0"},"reference-count":27,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2012,3]]},"DOI":"10.1109\/date.2012.6176711","type":"proceedings-article","created":{"date-parts":[[2013,2,19]],"date-time":"2013-02-19T13:16:29Z","timestamp":1361279789000},"page":"1501-1506","source":"Crossref","is-referenced-by-count":1,"title":["Power-efficient calibration and reconfiguration for on-chip optical communication"],"prefix":"10.1109","author":[{"family":"Yan Zheng","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"P.","family":"Lisherness","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Ming Gao","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"J.","family":"Bovington","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Shiyuan Yang","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"family":"Kwang-Ting Cheng","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"journal-title":"On-chip Optical and Electrical Communication Analysis and Design for System Level Performance and Reliability","year":"2010","author":"li","key":"19"},{"key":"17","doi-asserted-by":"publisher","DOI":"10.1364\/OL.33.002185"},{"key":"18","doi-asserted-by":"publisher","DOI":"10.1364\/OFC.2011.OWU4"},{"key":"15","article-title":"Device Modeling and System Simulation of Nanophotonic on-Chip Networks for Reliability, Power and Performance","author":"zheng","year":"2011","journal-title":"DAC"},{"key":"16","doi-asserted-by":"publisher","DOI":"10.1109\/PHOSST.2010.5553682"},{"key":"13","doi-asserted-by":"publisher","DOI":"10.1364\/OE.15.000430"},{"journal-title":"Theory and Design of High-Index-Contrast Microphotonic Circuits","year":"2008","author":"popovic","key":"14"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1109\/ISCA.2008.35"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2010.2089072"},{"key":"21","doi-asserted-by":"publisher","DOI":"10.1007\/s00339-009-5120-7"},{"key":"20","doi-asserted-by":"publisher","DOI":"10.1038\/nature03569"},{"key":"22","doi-asserted-by":"publisher","DOI":"10.1109\/NOCS.2009.5071460"},{"key":"23","doi-asserted-by":"crossref","first-page":"54","DOI":"10.1109\/MDT.2010.75","article-title":"Global on-chip coordination at light speed","volume":"27","author":"li","year":"2010","journal-title":"IEEE Design &Test of Computers"},{"year":"2010","key":"24"},{"key":"25","doi-asserted-by":"publisher","DOI":"10.1364\/OE.16.004309"},{"key":"26","doi-asserted-by":"publisher","DOI":"10.1145\/2000064.2000116"},{"key":"27","doi-asserted-by":"publisher","DOI":"10.1145\/1250662.1250670"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1364\/CLEO_SI.2011.CThZ2"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1038\/nphoton.2010.179"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1007\/s00339-009-5109-2"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2009.2034444"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1063\/1.3001587"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/GROUP4.2008.4638077"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1364\/OL.29.002584"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1364\/OE.15.000430"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1364\/OE.19.017758"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2008.78"}],"event":{"name":"2012 Design, Automation & Test in Europe Conference & Exhibition (DATE 2012)","start":{"date-parts":[[2012,3,12]]},"location":"Dresden","end":{"date-parts":[[2012,3,16]]}},"container-title":["2012 Design, Automation & Test in Europe Conference & Exhibition (DATE)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/6171057\/6176405\/06176711.pdf?arnumber=6176711","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,21]],"date-time":"2017-06-21T03:48:10Z","timestamp":1498016890000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6176711\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2012,3]]},"references-count":27,"URL":"https:\/\/doi.org\/10.1109\/date.2012.6176711","relation":{},"subject":[],"published":{"date-parts":[[2012,3]]}}}