{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T21:02:04Z","timestamp":1725483724423},"reference-count":11,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018,11]]},"DOI":"10.1109\/dcis.2018.8681485","type":"proceedings-article","created":{"date-parts":[[2019,4,27]],"date-time":"2019-04-27T03:14:45Z","timestamp":1556334885000},"page":"1-6","source":"Crossref","is-referenced-by-count":3,"title":["Single Event Transient injection in large mixed-signal circuits"],"prefix":"10.1109","author":[{"given":"Valentin","family":"Gutierrez","sequence":"first","affiliation":[]},{"given":"Gildas","family":"Leger","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","first-page":"573","article-title":"Single event transient characterisation of analog IC’s for ESA’s satellites","author":"harboe-sorensen","year":"1999","journal-title":"Radiation and its Effects on Components and Systems RADECS"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2004.835111"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2014.7035281"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2015.2456831"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2004.842721"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2004.839162"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4615-6043-2"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2013.2254722"},{"key":"ref2","article-title":"Single Event Transients trigger instability in Sigma-Delta Modulators","author":"perianez","year":"2014","journal-title":"Proc Conf on Design of Circuits and Integrated Systems (DCIS)"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/IMS3TW.2017.7995200"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/23.490903"}],"event":{"name":"2018 Conference on Design of Circuits and Integrated Systems (DCIS)","start":{"date-parts":[[2018,11,14]]},"location":"Lyon, France","end":{"date-parts":[[2018,11,16]]}},"container-title":["2018 Conference on Design of Circuits and Integrated Systems (DCIS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8679952\/8681454\/08681485.pdf?arnumber=8681485","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,12,22]],"date-time":"2021-12-22T21:29:39Z","timestamp":1640208579000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8681485\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,11]]},"references-count":11,"URL":"https:\/\/doi.org\/10.1109\/dcis.2018.8681485","relation":{},"subject":[],"published":{"date-parts":[[2018,11]]}}}