{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,21]],"date-time":"2026-04-21T23:15:29Z","timestamp":1776813329366,"version":"3.51.2"},"reference-count":24,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2018,11]]},"DOI":"10.1109\/dcis.2018.8681487","type":"proceedings-article","created":{"date-parts":[[2019,4,27]],"date-time":"2019-04-27T07:14:45Z","timestamp":1556349285000},"page":"1-6","source":"Crossref","is-referenced-by-count":12,"title":["From RTL Liveness Assertions to Cost-Effective Hardware Checkers"],"prefix":"10.1109","author":[{"given":"Ranganathan","family":"Hariharan","sequence":"first","affiliation":[]},{"given":"Tara","family":"Ghasempouri","sequence":"additional","affiliation":[]},{"given":"Behrad","family":"Niazmand","sequence":"additional","affiliation":[]},{"given":"Jaan","family":"Raik","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.7873\/DATE.2015.0110"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/CODES-ISSS.2013.6659015"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/VLSI-SoC.2015.7314438"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ITC-Asia.2018.00021"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1007\/3-540-48153-2_21"},{"key":"ref15","article-title":"Coverage estimation for symbolic model checking","author":"hoskote","year":"0","journal-title":"Proc of ACM\/IEEE DAC"},{"key":"ref16","article-title":"Dos and don’ts of CTL state coverage estimation","author":"jayakumar","year":"0","journal-title":"Proc of ACM\/IEEE DAC"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2007.1012"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/S1571-0661(04)80410-9"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1016\/j.entcs.2005.11.018"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-319-46097-0_10"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1007\/s10836-013-5403-y"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2017.7968211"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ReCoSoC.2015.7238079"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2013.2241176"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/VLSID.2014.20"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1145\/1837274.1837466"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1145\/1837274.1837466"},{"key":"ref1","author":"foster","year":"2004","journal-title":"Assertion-Based Design 2nd Edition"},{"key":"ref20","article-title":"Recognizing safety and liveness","author":"alpern","year":"1986","journal-title":"Ithaca NY USA Tech Rep"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1145\/775047.775053"},{"key":"ref21","year":"0"},{"key":"ref24","year":"1994","journal-title":"Synopsys Design Compiler"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/ETS.2007.43"}],"event":{"name":"2018 Conference on Design of Circuits and Integrated Systems (DCIS)","location":"Lyon, France","start":{"date-parts":[[2018,11,14]]},"end":{"date-parts":[[2018,11,16]]}},"container-title":["2018 Conference on Design of Circuits and Integrated Systems (DCIS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8679952\/8681454\/08681487.pdf?arnumber=8681487","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2021,12,23]],"date-time":"2021-12-23T12:37:26Z","timestamp":1640263046000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8681487\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2018,11]]},"references-count":24,"URL":"https:\/\/doi.org\/10.1109\/dcis.2018.8681487","relation":{},"subject":[],"published":{"date-parts":[[2018,11]]}}}