{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,4,29]],"date-time":"2025-04-29T04:45:52Z","timestamp":1745901952602},"reference-count":6,"publisher":"IEEE","license":[{"start":{"date-parts":[[2019,11,1]],"date-time":"2019-11-01T00:00:00Z","timestamp":1572566400000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2019,11,1]],"date-time":"2019-11-01T00:00:00Z","timestamp":1572566400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2019,11,1]],"date-time":"2019-11-01T00:00:00Z","timestamp":1572566400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2019,11]]},"DOI":"10.1109\/dcis201949030.2019.8959939","type":"proceedings-article","created":{"date-parts":[[2020,1,16]],"date-time":"2020-01-16T21:11:20Z","timestamp":1579209080000},"page":"1-6","source":"Crossref","is-referenced-by-count":8,"title":["Weak and Strong SRAM cells analysis in embedded memories for PUF applications"],"prefix":"10.1109","author":[{"given":"A.","family":"Alheyasat","sequence":"first","affiliation":[]},{"given":"G.","family":"Torrens","sequence":"additional","affiliation":[]},{"given":"S.","family":"Bota","sequence":"additional","affiliation":[]},{"given":"B.","family":"Alorda","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ICMTS.2016.7476191"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2016.65"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2015.7168907"},{"key":"ref5","first-page":"273","article-title":"Towards a Highly Reliable SRAM-Based PUFs","author":"elena ioana vatajelu","year":"2016","journal-title":"Design Automation Test in Europe Conference Exhibition (DATE)"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2014.2320516"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.adhoc.2012.02.016"}],"event":{"name":"2019 XXXIV Conference on Design of Circuits and Integrated Systems (DCIS)","start":{"date-parts":[[2019,11,20]]},"location":"Bilbao, Spain","end":{"date-parts":[[2019,11,22]]}},"container-title":["2019 XXXIV Conference on Design of Circuits and Integrated Systems (DCIS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/8952591\/8959817\/08959939.pdf?arnumber=8959939","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,7,14]],"date-time":"2022-07-14T23:13:14Z","timestamp":1657840394000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/8959939\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2019,11]]},"references-count":6,"URL":"https:\/\/doi.org\/10.1109\/dcis201949030.2019.8959939","relation":{},"subject":[],"published":{"date-parts":[[2019,11]]}}}