{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,1,8]],"date-time":"2026-01-08T04:21:18Z","timestamp":1767846078410,"version":"3.49.0"},"reference-count":41,"publisher":"IEEE","license":[{"start":{"date-parts":[[2022,11,16]],"date-time":"2022-11-16T00:00:00Z","timestamp":1668556800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2022,11,16]],"date-time":"2022-11-16T00:00:00Z","timestamp":1668556800000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2022,11,16]]},"DOI":"10.1109\/dcis55711.2022.9970163","type":"proceedings-article","created":{"date-parts":[[2022,12,8]],"date-time":"2022-12-08T18:40:24Z","timestamp":1670524824000},"page":"01-06","source":"Crossref","is-referenced-by-count":4,"title":["An enhanced Verilog-A compact model for bipolar RRAMs including transient thermal effects and series resistance"],"prefix":"10.1109","author":[{"ORCID":"https:\/\/orcid.org\/0000-0002-3475-9440","authenticated-orcid":false,"given":"D.","family":"Maldonado","sequence":"first","affiliation":[{"name":"Universidad de Granada (UGR),Departamento de Electrónicay Tecnología de Computadores,Granada,Spain"}]},{"ORCID":"https:\/\/orcid.org\/0000-0002-8866-7568","authenticated-orcid":false,"given":"F.","family":"Jimenez-Molinos","sequence":"additional","affiliation":[{"name":"Universidad de Granada (UGR),Departamento de Electrónicay Tecnología de Computadores,Granada,Spain"}]},{"ORCID":"https:\/\/orcid.org\/0000-0003-1662-6457","authenticated-orcid":false,"given":"J. B.","family":"Roldan","sequence":"additional","affiliation":[{"name":"Universidad de Granada (UGR),Departamento de Electrónicay Tecnología de Computadores,Granada,Spain"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-6792-4556","authenticated-orcid":false,"given":"M. B.","family":"Gonzalez","sequence":"additional","affiliation":[{"name":"Institut de Microelectrònica de Barcelona-Centre Nacional de Microelectrònica, Consejo Superior de Investigaciones Cientificas,Bellaterra,Spain"}]},{"ORCID":"https:\/\/orcid.org\/0000-0001-7758-4567","authenticated-orcid":false,"given":"F.","family":"Campabadal","sequence":"additional","affiliation":[{"name":"Institut de Microelectrònica de Barcelona-Centre Nacional de Microelectrònica, Consejo Superior de Investigaciones Cientificas,Bellaterra,Spain"}]}],"member":"263","reference":[{"key":"ref39","doi-asserted-by":"crossref","DOI":"10.1063\/1.3699369","article-title":"Analysis and modeing of resistive switching statistics","volume":"111","author":"long","year":"2012","journal-title":"Journal of Applied Physics"},{"key":"ref38","doi-asserted-by":"publisher","DOI":"10.1016\/j.mee.2022.111736"},{"key":"ref33","first-page":"1","article-title":"Intrinsic switching behavior in Hf02 RRAM by fast electrical measurements on novel 2R test structures","author":"fantini","year":"0","journal-title":"4th IEEE International Memory Workshop Milan"},{"key":"ref32","doi-asserted-by":"publisher","DOI":"10.1039\/C8FD00116B"},{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1063\/5.0055982"},{"key":"ref30","doi-asserted-by":"publisher","DOI":"10.1109\/DCIS.2016.7845386"},{"key":"ref37","doi-asserted-by":"publisher","DOI":"10.1016\/j.mee.2020.111232"},{"key":"ref36","doi-asserted-by":"publisher","DOI":"10.1016\/j.mee.2017.11.007"},{"key":"ref35","doi-asserted-by":"publisher","DOI":"10.1016\/j.sse.2015.04.008"},{"key":"ref34","doi-asserted-by":"publisher","DOI":"10.1063\/5.0031575"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1126\/science.1254642"},{"key":"ref40","doi-asserted-by":"publisher","DOI":"10.1021\/acs.nanolett.5b00697"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1002\/aisy.202200001"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1038\/nature14441"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1002\/smll.202101100"},{"key":"ref14","doi-asserted-by":"crossref","first-page":"60","DOI":"10.1038\/s41586-018-0180-5","article-title":"Equivalent-accuracy accelerated neural-network training using analogue memory","volume":"558","author":"ambrogio","year":"2018","journal-title":"Nature"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1016\/j.chaos.2021.110723"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1016\/j.mee.2019.05.004"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1016\/j.chaos.2020.110461"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1016\/j.mee.2017.04.043"},{"key":"ref19","first-page":"1","article-title":"Advanced data encryption using two-dimensional materials","volume":"2100185","author":"lanza","year":"2021","journal-title":"Advanced Materials"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2013.2287755"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/VLSICircuits18222.2020.9163014"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2016.2545412"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1021\/acsnano.1c06980"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/PROC.1976.10092"},{"key":"ref29","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2012.2210856"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2019.8662393"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1038\/ncomms3072"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/MCAS.2021.3092533"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1002\/aelm.201800143"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.3390\/electronics10030346"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.mser.2014.06.002"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6463\/ab7bb6"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1088\/1361-6528\/ab5f9a"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2015.2418114"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1021\/acsami.7b19836"},{"key":"ref41","doi-asserted-by":"publisher","DOI":"10.1126\/science.abj9979"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1039\/C5NR02258D"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.3390\/electronics10060645"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.3390\/nano11051261"}],"event":{"name":"2022 37th Conference on Design of Circuits and Integrated Circuits (DCIS)","location":"Pamplona, Spain","start":{"date-parts":[[2022,11,16]]},"end":{"date-parts":[[2022,11,18]]}},"container-title":["2022 37th Conference on Design of Circuits and Integrated Circuits (DCIS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9969904\/9970010\/09970163.pdf?arnumber=9970163","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,12,26]],"date-time":"2022-12-26T19:36:11Z","timestamp":1672083371000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9970163\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2022,11,16]]},"references-count":41,"URL":"https:\/\/doi.org\/10.1109\/dcis55711.2022.9970163","relation":{},"subject":[],"published":{"date-parts":[[2022,11,16]]}}}