{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,1,11]],"date-time":"2025-01-11T05:33:56Z","timestamp":1736573636363,"version":"3.32.0"},"reference-count":17,"publisher":"IEEE","license":[{"start":{"date-parts":[[2024,11,13]],"date-time":"2024-11-13T00:00:00Z","timestamp":1731456000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2024,11,13]],"date-time":"2024-11-13T00:00:00Z","timestamp":1731456000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2024,11,13]]},"DOI":"10.1109\/dcis62603.2024.10769157","type":"proceedings-article","created":{"date-parts":[[2024,12,3]],"date-time":"2024-12-03T18:54:06Z","timestamp":1733252046000},"page":"1-6","source":"Crossref","is-referenced-by-count":0,"title":["Single Event Upset Tolerant TRNG Design and Its Tests Under Radiation"],"prefix":"10.1109","author":[{"given":"\u00d6zg\u00fcr Ozan","family":"Y\u0131lmaz","sequence":"first","affiliation":[{"name":"Istanbul Technical University,Dept. of Electron. and Commun. Eng.,Istanbul,Turkey"}]},{"given":"Melahat Bilge","family":"Demirk\u00f6z","sequence":"additional","affiliation":[{"name":"METU-IVMER Middle East Technical University,Ankara,Turkey"}]},{"given":"M\u00fc\u015ftak Erhan","family":"Yal\u00e7\u0131n","sequence":"additional","affiliation":[{"name":"Istanbul Technical University,Dept. of Electron. and Commun. Eng.,Istanbul,Turkey"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1587\/transinf.e95.d.426"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1007\/978-3-642-23951-9_2"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1155\/2009\/501672"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/tcsii.2019.2919891"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.6028\/NIST.SP.800-90B"},{"volume-title":"Federal Ofice for Information Security","year":"2023","key":"ref6"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1016\/j.nima.2018.11.075"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/REDW.2015.7336739"},{"volume-title":"Predicting on-orbit static single event upset rates in Xilinx Virtex FPGAs.","year":"2006","author":"Engel","key":"ref9"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.3390\/e20070513"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1117\/12.2280978"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.2014.6946136"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TCSII.2022.3211278"},{"volume-title":"7 Series FPGAs Configurable Logic Block User Guide","key":"ref14"},{"key":"ref15","first-page":"2974","volume-title":"METU-DBL: A Cost Effective Proton Irradiation Facility, 44th COSPAR Scientific Assembly.","volume":"44","author":"Bilge Demirk\u00f6z","year":"2022"},{"volume-title":"SpyDrNet-TMR Netlist Analysis and Transformation","year":"2018","key":"ref16"},{"volume-title":"Metastability based TRNG Design on FPGA and SEE Test Under Space Radiation","year":"2023","author":"Y\u00f6lmaz","key":"ref17"}],"event":{"name":"2024 39th Conference on Design of Circuits and Integrated Systems (DCIS)","start":{"date-parts":[[2024,11,13]]},"location":"Catania, Italy","end":{"date-parts":[[2024,11,15]]}},"container-title":["2024 39th Conference on Design of Circuits and Integrated Systems (DCIS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/10769040\/10769041\/10769157.pdf?arnumber=10769157","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,1,10]],"date-time":"2025-01-10T19:56:07Z","timestamp":1736538967000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10769157\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2024,11,13]]},"references-count":17,"URL":"https:\/\/doi.org\/10.1109\/dcis62603.2024.10769157","relation":{},"subject":[],"published":{"date-parts":[[2024,11,13]]}}}