{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T04:05:50Z","timestamp":1725509150849},"reference-count":9,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2007]]},"DOI":"10.1109\/ddecs.2007.4295254","type":"proceedings-article","created":{"date-parts":[[2008,7,18]],"date-time":"2008-07-18T12:49:29Z","timestamp":1216385369000},"page":"1-6","source":"Crossref","is-referenced-by-count":0,"title":["Extended Fault Detection Techniques for Systems-on-Chip"],"prefix":"10.1109","author":[{"given":"P.","family":"Bernardi","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"L.","family":"Bolzani","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"M. Sonza","family":"Reorda","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/DFTVS.2003.1250158"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/23.903758"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1984.1676475"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/24.994926"},{"key":"ref8","first-page":"228","article-title":"Software-Implemented Hardware Fault Tolerance","author":"goloubeva","year":"0","journal-title":"Springer Science + Business Media LLC"},{"year":"2004","key":"ref7"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2006.15"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/HLDVT.2005.1568818"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2002.1003776"}],"event":{"name":"2007 IEEE Design and Diagnostics of Electronic Circuits and Systems","start":{"date-parts":[[2007,4,11]]},"location":"Krakow, Poland","end":{"date-parts":[[2007,4,13]]}},"container-title":["2007 IEEE Design and Diagnostics of Electronic Circuits and Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4295238\/4295239\/04295254.pdf?arnumber=4295254","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,15]],"date-time":"2017-03-15T17:41:15Z","timestamp":1489599675000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/4295254\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2007]]},"references-count":9,"URL":"https:\/\/doi.org\/10.1109\/ddecs.2007.4295254","relation":{},"subject":[],"published":{"date-parts":[[2007]]}}}