{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T15:54:13Z","timestamp":1725551653414},"reference-count":10,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2007]]},"DOI":"10.1109\/ddecs.2007.4295271","type":"proceedings-article","created":{"date-parts":[[2008,7,18]],"date-time":"2008-07-18T12:49:29Z","timestamp":1216385369000},"page":"1-4","source":"Crossref","is-referenced-by-count":0,"title":["Avoiding Crosstalk Influence on Interconnect Delay Fault Testing"],"prefix":"10.1109","author":[{"given":"T.","family":"Garbolino","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"K.","family":"Gucwa","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"M.","family":"Kopec","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"A.","family":"Hlawiczka","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2004.19"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2002.1033789"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2005.49"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2004.826197"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED.2006.143"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1145\/337292.337597"},{"key":"ref7","first-page":"449","article-title":"Interconnect Delay Fault Testing with IEEE 1149.1","author":"wu","year":"0","journal-title":"Proc Intern Test Conf 1999 (ITC'99)"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.1999.810665"},{"key":"ref9","first-page":"204","article-title":"Embeded-Software-Based Approach to Testing Crosstalk-Induced Faults at On-Chip Buses","author":"lai","year":"0","journal-title":"Proc 19th VLSI Test Symp VTS'01 IEEE CS Press"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1023\/A:1016514129296"}],"event":{"name":"2007 IEEE Design and Diagnostics of Electronic Circuits and Systems","start":{"date-parts":[[2007,4,11]]},"location":"Krakow, Poland","end":{"date-parts":[[2007,4,13]]}},"container-title":["2007 IEEE Design and Diagnostics of Electronic Circuits and Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4295238\/4295239\/04295271.pdf?arnumber=4295271","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,15]],"date-time":"2017-03-15T20:47:11Z","timestamp":1489610831000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/4295271\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2007]]},"references-count":10,"URL":"https:\/\/doi.org\/10.1109\/ddecs.2007.4295271","relation":{},"subject":[],"published":{"date-parts":[[2007]]}}}