{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,29]],"date-time":"2024-10-29T14:55:48Z","timestamp":1730213748752,"version":"3.28.0"},"reference-count":10,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2008,4]]},"DOI":"10.1109\/ddecs.2008.4538752","type":"proceedings-article","created":{"date-parts":[[2008,6,10]],"date-time":"2008-06-10T15:58:11Z","timestamp":1213113491000},"page":"1-4","source":"Crossref","is-referenced-by-count":3,"title":["Process Tolerant Design Using Thermal and Power-Supply Tolerance in Pipeline Based Circuits"],"prefix":"10.1109","author":[{"given":"J.","family":"Semiao","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"J. J.","family":"Rodriguez-Andina","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"F.","family":"Vargas","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"M.","family":"Santos","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"I.","family":"Teixeira","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"P.","family":"Teixeira","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/ICVD.1999.745199"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.1998.144307"},{"key":"10","article-title":"power supply noise in delay testing","author":"wang","year":"2006","journal-title":"Proc Int Test Conf"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/MM.2004.85"},{"key":"7","article-title":"digital circuit signal integrity enhancement by monitoring power grid activity","author":"semia?o","year":"2007","journal-title":"Proc IEEE Latin American Test Workshop"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2003.1271097"},{"key":"5","first-page":"641","article-title":"time borrowing in high-speed functional units using skew-tolerant domino circuits","volume":"5","author":"jung","year":"2000","journal-title":"Proc IEEE Int Symp Circuits Syst (ISCAS)"},{"year":"0","key":"4"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/DFT.2007.60"},{"year":"0","key":"8"}],"event":{"name":"2008 11th International Workshop on Design and Diagnostics of Electronic Circuits and Systems (DDECS)","start":{"date-parts":[[2008,4,16]]},"location":"Bratislava, Slovakia","end":{"date-parts":[[2008,4,18]]}},"container-title":["2008 11th IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4534845\/4538735\/04538752.pdf?arnumber=4538752","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,16]],"date-time":"2017-03-16T13:44:03Z","timestamp":1489671843000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/4538752\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2008,4]]},"references-count":10,"URL":"https:\/\/doi.org\/10.1109\/ddecs.2008.4538752","relation":{},"subject":[],"published":{"date-parts":[[2008,4]]}}}