{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,3]],"date-time":"2024-09-03T23:20:12Z","timestamp":1725405612551},"reference-count":10,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2008,4]]},"DOI":"10.1109\/ddecs.2008.4538800","type":"proceedings-article","created":{"date-parts":[[2008,6,10]],"date-time":"2008-06-10T15:58:11Z","timestamp":1213113491000},"page":"1-4","source":"Crossref","is-referenced-by-count":0,"title":["Web-Based Framework for Parallel Distributed Test"],"prefix":"10.1109","author":[{"given":"Eero","family":"Ivask","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jaan","family":"Raik","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Raimund","family":"Ubar","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.1987.295165"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.1995.480147"},{"year":"0","key":"10"},{"year":"0","key":"1"},{"year":"0","key":"7"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1007\/1-4020-8139-1_46"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2002.998273"},{"journal-title":"MOSCITO","year":"0","key":"4"},{"year":"0","key":"9"},{"year":"0","key":"8"}],"event":{"name":"2008 11th International Workshop on Design and Diagnostics of Electronic Circuits and Systems (DDECS)","start":{"date-parts":[[2008,4,16]]},"location":"Bratislava, Slovakia","end":{"date-parts":[[2008,4,18]]}},"container-title":["2008 11th IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4534845\/4538735\/04538800.pdf?arnumber=4538800","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,16]],"date-time":"2017-03-16T13:42:20Z","timestamp":1489671740000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/4538800\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2008,4]]},"references-count":10,"URL":"https:\/\/doi.org\/10.1109\/ddecs.2008.4538800","relation":{},"subject":[],"published":{"date-parts":[[2008,4]]}}}