{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T02:25:02Z","timestamp":1725416702043},"reference-count":6,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2008,4]]},"DOI":"10.1109\/ddecs.2008.4538803","type":"proceedings-article","created":{"date-parts":[[2008,6,10]],"date-time":"2008-06-10T15:58:11Z","timestamp":1213113491000},"page":"1-4","source":"Crossref","is-referenced-by-count":0,"title":["Virtual Testing Environment for A\/D Converters in Verilog-A and Maple Platform"],"prefix":"10.1109","author":[{"given":"Ondrej","family":"Subrt","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Petr","family":"Struhovsky","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Pravoslav","family":"Martinek","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jiri","family":"Hospodka","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"3","first-page":"1241","article-title":"ieee standard for terminology and test methods for analog-to-digital converters","year":"2000","journal-title":"IEEE Std"},{"year":"0","key":"2"},{"key":"1","first-page":"447","author":"burns","year":"2001","journal-title":"An Introduction to Mixed-Signal IC Test and Measurement"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1016\/j.measurement.2006.11.002"},{"key":"5","first-page":"95","article-title":"modeling of the analog-digital interfaces (in slovak: modelovanie analogovo cislicovych rozhrani)","author":"michaeli","year":"2001","journal-title":"Monography TU Kos?ice Mercury-Sme?kal"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/IMTC.2007.379094"}],"event":{"name":"2008 11th International Workshop on Design and Diagnostics of Electronic Circuits and Systems (DDECS)","start":{"date-parts":[[2008,4,16]]},"location":"Bratislava, Slovakia","end":{"date-parts":[[2008,4,18]]}},"container-title":["2008 11th IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4534845\/4538735\/04538803.pdf?arnumber=4538803","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,16]],"date-time":"2017-03-16T13:42:21Z","timestamp":1489671741000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/4538803\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2008,4]]},"references-count":6,"URL":"https:\/\/doi.org\/10.1109\/ddecs.2008.4538803","relation":{},"subject":[],"published":{"date-parts":[[2008,4]]}}}