{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T19:20:00Z","timestamp":1725564000403},"reference-count":0,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2009]]},"DOI":"10.1109\/ddecs.2009.5012084","type":"proceedings-article","created":{"date-parts":[[2009,6,2]],"date-time":"2009-06-02T16:44:32Z","timestamp":1243961072000},"page":"1-1","source":"Crossref","is-referenced-by-count":0,"title":["Design tools and circuit solutions for degradation-resilient analog circuits in nanometer CMOS"],"prefix":"10.1109","author":[{"given":"Georges","family":"Gielen","sequence":"first","affiliation":[]}],"member":"263","event":{"name":"2009 12th International Symposium on Design and Diagnostics of Electronic Circuits & Systems","start":{"date-parts":[[2009,4,15]]},"location":"Liberec, Czech Republic","end":{"date-parts":[[2009,4,17]]}},"container-title":["2009 12th International Symposium on Design and Diagnostics of Electronic Circuits & Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4957849\/5012077\/05012084.pdf?arnumber=5012084","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,18]],"date-time":"2017-03-18T00:33:39Z","timestamp":1489797219000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5012084\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2009]]},"references-count":0,"URL":"https:\/\/doi.org\/10.1109\/ddecs.2009.5012084","relation":{},"subject":[],"published":{"date-parts":[[2009]]}}}