{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,22]],"date-time":"2024-10-22T18:05:11Z","timestamp":1729620311565,"version":"3.28.0"},"reference-count":19,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2009]]},"DOI":"10.1109\/ddecs.2009.5012097","type":"proceedings-article","created":{"date-parts":[[2009,6,2]],"date-time":"2009-06-02T20:44:32Z","timestamp":1243975472000},"page":"44-49","source":"Crossref","is-referenced-by-count":1,"title":["The impact of EFSM composition on functional ATPG"],"prefix":"10.1109","author":[{"given":"Davide","family":"Bresolin","sequence":"first","affiliation":[]},{"given":"Giuseppe","family":"Di Guglielmo","sequence":"additional","affiliation":[]},{"given":"Franco","family":"Fummi","sequence":"additional","affiliation":[]},{"given":"Graziano","family":"Pravadelli","sequence":"additional","affiliation":[]},{"given":"Tiziano","family":"Villa","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"19","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2008.4681565"},{"key":"17","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1977.1674886"},{"key":"18","doi-asserted-by":"crossref","first-page":"163","DOI":"10.1109\/DAC.2003.1218927","article-title":"the synthesis of cyclic combinational circuits","author":"riedel","year":"2003","journal-title":"Proceedings of the 40th Design Automation Conference DAC 2003"},{"key":"15","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4757-2649-7_1"},{"key":"16","doi-asserted-by":"crossref","first-page":"162","DOI":"10.1109\/T-C.1970.222884","article-title":"the necessity of closed circuit loops in minimal combinational circuits","volume":"c 19","author":"kautz","year":"1970","journal-title":"IEEE Transactions on Computers"},{"key":"13","doi-asserted-by":"crossref","first-page":"187","DOI":"10.1049\/iet-cdt:20060139","article-title":"improving high-level and gate-level testing with fate: a functional atpg traversing unstabilized efsms","volume":"1","author":"di guglielmo","year":"2007","journal-title":"Computers & Digital Techniques IET"},{"journal-title":"Eclipse","year":"0","key":"14"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2004.1275300"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1145\/225871.225880"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1998.743202"},{"key":"2","first-page":"658","article-title":"laerte++: an object oriented high-level tpg for systemc design","author":"fin","year":"2003","journal-title":"Proc of ECSI FDL"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2001.990286"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/CMPSAC.2002.1045023"},{"key":"7","first-page":"156","article-title":"design validation of behavioral vhdl descriptions for arbitrary fault models","author":"xin","year":"2005","journal-title":"Proc IEEE ETS"},{"key":"6","first-page":"187","article-title":"test generation for nonseparable rtl controller-datapath circuits using a satisfiability based approach","author":"lingappan","year":"2003","journal-title":"Proc IEEE ICC"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2003.1270851"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/43.913758"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2006.881333"},{"key":"8","first-page":"213","article-title":"an rt-level atpg based on clustering of circuit states","author":"li","year":"2001","journal-title":"Proc 10th Asian Test Symp"}],"event":{"name":"2009 12th International Symposium on Design and Diagnostics of Electronic Circuits & Systems","start":{"date-parts":[[2009,4,15]]},"location":"Liberec, Czech Republic","end":{"date-parts":[[2009,4,17]]}},"container-title":["2009 12th International Symposium on Design and Diagnostics of Electronic Circuits & Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4957849\/5012077\/05012097.pdf?arnumber=5012097","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,18]],"date-time":"2017-06-18T20:34:24Z","timestamp":1497818064000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5012097\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2009]]},"references-count":19,"URL":"https:\/\/doi.org\/10.1109\/ddecs.2009.5012097","relation":{},"subject":[],"published":{"date-parts":[[2009]]}}}