{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,3]],"date-time":"2024-09-03T22:46:38Z","timestamp":1725403598013},"reference-count":8,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2009]]},"DOI":"10.1109\/ddecs.2009.5012114","type":"proceedings-article","created":{"date-parts":[[2009,6,2]],"date-time":"2009-06-02T16:44:32Z","timestamp":1243961072000},"page":"136-139","source":"Crossref","is-referenced-by-count":3,"title":["Structural test of programmed FPGA circuits"],"prefix":"10.1109","author":[{"given":"Martin","family":"Rozkovec","sequence":"first","affiliation":[]},{"given":"Ondrej","family":"Novak","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/PRDC.1999.816211"},{"key":"2","first-page":"10","article-title":"diagnosticky system pro obvod realizovany na fpga","author":"balach","year":"2008","journal-title":"Poc?i?tac?ove? Architektury a Diagnostika"},{"journal-title":"Stratix III Device Handbook","article-title":"seu mitigation in stratix iii devices","year":"0","key":"1"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.1997.639662"},{"journal-title":"A Designer's Guide to Built-In Self-Test","year":"2002","author":"stroud","key":"6"},{"journal-title":"Fault Tolerance Techniques for SRAM-based FPGAs","year":"2006","author":"kastensmidt","key":"5"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/DDECS.2006.1649634"},{"journal-title":"Virtex-4 FPGA User Guide","year":"0","key":"8"}],"event":{"name":"2009 12th International Symposium on Design and Diagnostics of Electronic Circuits & Systems","start":{"date-parts":[[2009,4,15]]},"location":"Liberec, Czech Republic","end":{"date-parts":[[2009,4,17]]}},"container-title":["2009 12th International Symposium on Design and Diagnostics of Electronic Circuits &amp; Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4957849\/5012077\/05012114.pdf?arnumber=5012114","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,18]],"date-time":"2017-03-18T00:37:11Z","timestamp":1489797431000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5012114\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2009]]},"references-count":8,"URL":"https:\/\/doi.org\/10.1109\/ddecs.2009.5012114","relation":{},"subject":[],"published":{"date-parts":[[2009]]}}}