{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,29]],"date-time":"2024-10-29T14:56:06Z","timestamp":1730213766225,"version":"3.28.0"},"reference-count":10,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2009]]},"DOI":"10.1109\/ddecs.2009.5012133","type":"proceedings-article","created":{"date-parts":[[2009,6,2]],"date-time":"2009-06-02T20:44:32Z","timestamp":1243975472000},"page":"222-225","source":"Crossref","is-referenced-by-count":1,"title":["Global parametric faults identification with the use of Differential Evolution"],"prefix":"10.1109","author":[{"given":"P.","family":"Jantos","sequence":"first","affiliation":[]},{"given":"D.","family":"Grzechca","sequence":"additional","affiliation":[]},{"given":"J.","family":"Rutkowski","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"journal-title":"Integrated Electronics Analog and Digital Circuits and Systems","year":"1972","author":"millman","key":"3"},{"journal-title":"Design of Analog Integrated Circuits and Systems","year":"1994","author":"laker","key":"2"},{"journal-title":"Differential Evolution A Practical Approach to Global Optimization","year":"2005","author":"price","key":"10"},{"journal-title":"Fault Diagnosis of Analogue Integrated Circuits","year":"2005","author":"kabisatpathy","key":"1"},{"journal-title":"Analysis and Design of Analog Integrated Circuits","year":"2001","author":"gray","key":"7"},{"year":"2004","author":"van","key":"6"},{"journal-title":"Design of Analog CMOS Integrated Circuits","year":"2001","author":"razavi","key":"5"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1002\/0470863803"},{"key":"9","first-page":"281","article-title":"global parametric faults in analogue electronic integrated circuits: two approaches to classification with the use of differential evolution","volume":"1","author":"jantos","year":"0","journal-title":"The 2nd European Computing Conference ECCV8"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/DDECS.2008.4538806"}],"event":{"name":"2009 12th International Symposium on Design and Diagnostics of Electronic Circuits & Systems","start":{"date-parts":[[2009,4,15]]},"location":"Liberec, Czech Republic","end":{"date-parts":[[2009,4,17]]}},"container-title":["2009 12th International Symposium on Design and Diagnostics of Electronic Circuits & Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/4957849\/5012077\/05012133.pdf?arnumber=5012133","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,18]],"date-time":"2017-03-18T04:37:07Z","timestamp":1489811827000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5012133\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2009]]},"references-count":10,"URL":"https:\/\/doi.org\/10.1109\/ddecs.2009.5012133","relation":{},"subject":[],"published":{"date-parts":[[2009]]}}}