{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T04:32:16Z","timestamp":1725424336407},"reference-count":16,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2010,4]]},"DOI":"10.1109\/ddecs.2010.5491758","type":"proceedings-article","created":{"date-parts":[[2010,7,6]],"date-time":"2010-07-06T18:14:22Z","timestamp":1278440062000},"page":"317-322","source":"Crossref","is-referenced-by-count":1,"title":["A deterministic approach for hardware fault injection in asynchronous QDI logic"],"prefix":"10.1109","author":[{"given":"Werner","family":"Friesenbichler","sequence":"first","affiliation":[]},{"given":"Thomas","family":"Panhofer","sequence":"additional","affiliation":[]},{"given":"Andreas","family":"Steininger","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2006.143"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/5.362752"},{"key":"ref12","first-page":"55","article-title":"Efficient self-timing with level-encoded 2-phase dual-rail (ledr)","author":"dean","year":"1991","journal-title":"Proceedings of the 1991 University of California\/Santa Cruz conference on Advanced research in VLSI"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/12.123391"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/DSN.2004.1311875"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/VLSID.2007.131"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1023\/B:JETT.0000039608.48856.33"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/DCFTS.1999.814299"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2008.2000254"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/SPL.2008.4547739"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/SPL.2009.4914906"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS.2009.5195979"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/OLT.2004.1319669"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1023\/A:1025178014797"},{"journal-title":"Fault Injection Techniques and Tools for Embedded Systems Reliability Evaluation","year":"2003","author":"benso","key":"ref1"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/TDSC.2008.37"}],"event":{"name":"2010 IEEE 13th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)","start":{"date-parts":[[2010,4,14]]},"location":"Vienna","end":{"date-parts":[[2010,4,16]]}},"container-title":["13th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5484099\/5491740\/05491758.pdf?arnumber=5491758","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2018,9,7]],"date-time":"2018-09-07T21:37:18Z","timestamp":1536356238000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/5491758\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,4]]},"references-count":16,"URL":"https:\/\/doi.org\/10.1109\/ddecs.2010.5491758","relation":{},"subject":[],"published":{"date-parts":[[2010,4]]}}}