{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,6]],"date-time":"2024-09-06T11:12:50Z","timestamp":1725621170758},"reference-count":11,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2010,4]]},"DOI":"10.1109\/ddecs.2010.5491792","type":"proceedings-article","created":{"date-parts":[[2010,7,6]],"date-time":"2010-07-06T18:14:22Z","timestamp":1278440062000},"page":"167-172","source":"Crossref","is-referenced-by-count":9,"title":["Buffer-ring-based all-digital on-chip monitor for PMOS and NMOS process variability and aging effects"],"prefix":"10.1109","author":[{"given":"Tetsuya","family":"Iizuka","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Toru","family":"Nakura","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Kunihiro","family":"Asada","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2006.157"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TSM.2008.2004323"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/82.868466"},{"key":"ref6","first-page":"410","article-title":"Compact In-Situ Sensors for Monitoring Negative-Bias-Temperature-Instability Effect and Oxide Degradation","author":"karl","year":"2008","journal-title":"IEEE ISSCC Dig Tech Papers"},{"journal-title":"HSPICE Simulation and Analysis User Guide","year":"2009","key":"ref11"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TSM.2009.2017662"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2008.4523230"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ISSCC.2007.373463"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIC.2006.1705315"},{"key":"ref9","first-page":"412","article-title":"A Completely Digital On-Chip Circuit for Local Random-Variability Measurement","author":"rao","year":"2008","journal-title":"IEEE ISSCC Dig Tech Papers"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2007.910130"}],"event":{"name":"2010 IEEE 13th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)","start":{"date-parts":[[2010,4,14]]},"location":"Vienna","end":{"date-parts":[[2010,4,16]]}},"container-title":["13th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5484099\/5491740\/05491792.pdf?arnumber=5491792","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2018,9,7]],"date-time":"2018-09-07T21:37:10Z","timestamp":1536356230000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/5491792\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,4]]},"references-count":11,"URL":"https:\/\/doi.org\/10.1109\/ddecs.2010.5491792","relation":{},"subject":[],"published":{"date-parts":[[2010,4]]}}}