{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,3]],"date-time":"2024-09-03T21:00:41Z","timestamp":1725397241472},"reference-count":12,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2010,4]]},"DOI":"10.1109\/ddecs.2010.5491795","type":"proceedings-article","created":{"date-parts":[[2010,7,6]],"date-time":"2010-07-06T18:14:22Z","timestamp":1278440062000},"page":"161-166","source":"Crossref","is-referenced-by-count":1,"title":["Computation reduction for statistical analysis of the effect of nano-CMOS variability on asynchronous circuits"],"prefix":"10.1109","author":[{"given":"Zheng","family":"Xie","sequence":"first","affiliation":[]},{"given":"Doug","family":"Edwards","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1007\/978-0-387-75953-1"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4020-6488-3_18"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/ASYNC.2008.22"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2007.907802"},{"journal-title":"Principles of Asynchronous Circuit Design","year":"2005","author":"spars","key":"ref11"},{"journal-title":"International Technology Roadmap for Semiconductors 2009 edition","year":"2009","key":"ref5"},{"year":"0","key":"ref12"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/LED.2008.2001030"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2006.885683"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/ICCAD.2008.4681573"},{"journal-title":"Statistical Analysis and Optimization for VLSI Timing and Power","year":"2005","author":"srivastava","key":"ref9"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2003.815862"}],"event":{"name":"2010 IEEE 13th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)","start":{"date-parts":[[2010,4,14]]},"location":"Vienna","end":{"date-parts":[[2010,4,16]]}},"container-title":["13th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5484099\/5491740\/05491795.pdf?arnumber=5491795","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2018,9,7]],"date-time":"2018-09-07T21:37:27Z","timestamp":1536356247000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/5491795\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,4]]},"references-count":12,"URL":"https:\/\/doi.org\/10.1109\/ddecs.2010.5491795","relation":{},"subject":[],"published":{"date-parts":[[2010,4]]}}}