{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T02:29:06Z","timestamp":1725503346129},"reference-count":15,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2010,4]]},"DOI":"10.1109\/ddecs.2010.5491814","type":"proceedings-article","created":{"date-parts":[[2010,7,6]],"date-time":"2010-07-06T14:14:22Z","timestamp":1278425662000},"page":"66-71","source":"Crossref","is-referenced-by-count":15,"title":["Software-based self-repair of statically scheduled superscalar data paths"],"prefix":"10.1109","author":[{"given":"Mario","family":"Scholzel","sequence":"first","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/DDECS.2006.1649613"},{"journal-title":"Algorithms for Compiler-Assisted Design-Space-Exploration of Clustered VLIW ASIP Datapaths","year":"2001","author":"lapinskii","key":"ref11"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2003.1271109"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2004.18"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ICCD.1996.563542"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2004.86"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/DFTVS.1995.476954"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/DFTVS.2003.1250155"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS.2006.13"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/HIPC.1996.565839"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/12.895942"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/54.536099"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2005.84"},{"year":"2005","key":"ref1"},{"key":"ref9","article-title":"Repair Functions and Redundancy Management for Bus Structures","author":"kothe","year":"2007","journal-title":"Workshop on Dependability and Fault Tolerance at ARCS'07"}],"event":{"name":"2010 IEEE 13th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)","start":{"date-parts":[[2010,4,14]]},"location":"Vienna","end":{"date-parts":[[2010,4,16]]}},"container-title":["13th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5484099\/5491740\/05491814.pdf?arnumber=5491814","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2018,9,7]],"date-time":"2018-09-07T17:37:05Z","timestamp":1536341825000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/5491814\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,4]]},"references-count":15,"URL":"https:\/\/doi.org\/10.1109\/ddecs.2010.5491814","relation":{},"subject":[],"published":{"date-parts":[[2010,4]]}}}