{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T18:08:58Z","timestamp":1725473338199},"reference-count":0,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2010,4]]},"DOI":"10.1109\/ddecs.2010.5491828","type":"proceedings-article","created":{"date-parts":[[2010,7,6]],"date-time":"2010-07-06T18:14:22Z","timestamp":1278440062000},"page":"7-7","source":"Crossref","is-referenced-by-count":1,"title":["Advanced embedded memory testing: Reducing the defect per million level at lower test cost"],"prefix":"10.1109","author":[{"given":"Said","family":"Hamdioui","sequence":"first","affiliation":[]},{"given":"Ad J.","family":"van de Goor","sequence":"additional","affiliation":[]}],"member":"263","event":{"name":"2010 IEEE 13th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)","start":{"date-parts":[[2010,4,14]]},"location":"Vienna","end":{"date-parts":[[2010,4,16]]}},"container-title":["13th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5484099\/5491740\/05491828.pdf?arnumber=5491828","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2018,9,7]],"date-time":"2018-09-07T21:37:21Z","timestamp":1536356241000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/5491828\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2010,4]]},"references-count":0,"URL":"https:\/\/doi.org\/10.1109\/ddecs.2010.5491828","relation":{},"subject":[],"published":{"date-parts":[[2010,4]]}}}