{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T05:34:19Z","timestamp":1725428059644},"reference-count":0,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2011,4]]},"DOI":"10.1109\/ddecs.2011.5783034","type":"proceedings-article","created":{"date-parts":[[2011,6,7]],"date-time":"2011-06-07T17:09:21Z","timestamp":1307466561000},"page":"4-4","source":"Crossref","is-referenced-by-count":1,"title":["SiGe BiCMOS platform - baseline technology for More Than Moore process module integration"],"prefix":"10.1109","author":[{"given":"Bernd","family":"Tillack","sequence":"first","affiliation":[]}],"member":"263","event":{"name":"Systems (DDECS)","start":{"date-parts":[[2011,4,13]]},"location":"Cottbus, Germany","end":{"date-parts":[[2011,4,15]]}},"container-title":["14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5771301\/5783023\/05783034.pdf?arnumber=5783034","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,21]],"date-time":"2017-03-21T08:45:45Z","timestamp":1490085945000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5783034\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2011,4]]},"references-count":0,"URL":"https:\/\/doi.org\/10.1109\/ddecs.2011.5783034","relation":{},"subject":[],"published":{"date-parts":[[2011,4]]}}}