{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T08:06:03Z","timestamp":1725523563902},"reference-count":16,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2011,4]]},"DOI":"10.1109\/ddecs.2011.5783049","type":"proceedings-article","created":{"date-parts":[[2011,6,7]],"date-time":"2011-06-07T13:09:21Z","timestamp":1307452161000},"page":"65-70","source":"Crossref","is-referenced-by-count":3,"title":["An analog perspective on device reliability in 32nm high-κ metal gate technology"],"prefix":"10.1109","author":[{"given":"Florian Raoul","family":"Chouard","sequence":"first","affiliation":[]},{"given":"Shailesh","family":"More","sequence":"additional","affiliation":[]},{"given":"Michael","family":"Fulde","sequence":"additional","affiliation":[]},{"given":"Doris","family":"Schmitt-Landsiedel","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/VLSIT.2008.4588573"},{"journal-title":"Users' Manuals BSIMPro+\/RelXpert\/UltraSim","year":"2009","author":"inc","key":"ref11"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2010.5488724"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/ESSCIRC.2010.5619730"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2010.5488858"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2007.378337"},{"key":"ref16","first-page":"331","article-title":"Negative bias temperature instabilities in pMOSFET devices","author":"rauch","year":"0","journal-title":"Reliability Wearout Mechanisms in Advanced CMOS Technologies IEEE 2009"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2010.5488755"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2007.910437"},{"key":"ref6","article-title":"Reliability simulation and circuit-failure analysis in analog and mixed-signal applications","author":"yan","year":"2009","journal-title":"IEEE Trans Dev Mater Rel"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2005.859570"},{"key":"ref8","first-page":"171","article-title":"PMOS NBTI-induced circuit mismatch in advanced technologies","author":"agostinelli","year":"2004","journal-title":"Reliability Physics Symposium Proceedings 42nd Annual IEEE International"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2009.2019762"},{"key":"ref2","article-title":"Impact of degradation mechanism on analog differential amplifiers","author":"chouard","year":"2009","journal-title":"ESSCIRC Proceedings of the ESSCIRC"},{"journal-title":"ITRS Tech Rep","article-title":"Edition 2009","year":"2009","key":"ref1"},{"key":"ref9","first-page":"41","article-title":"Stress-induced MOSFET mismatch for analog circuits","author":"chen","year":"0","journal-title":"Proc IEEE Int Integrated Reliability Workshop Final Report"}],"event":{"name":"Systems (DDECS)","start":{"date-parts":[[2011,4,13]]},"location":"Cottbus, Germany","end":{"date-parts":[[2011,4,15]]}},"container-title":["14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5771301\/5783023\/05783049.pdf?arnumber=5783049","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,21]],"date-time":"2017-03-21T05:25:24Z","timestamp":1490073924000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5783049\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2011,4]]},"references-count":16,"URL":"https:\/\/doi.org\/10.1109\/ddecs.2011.5783049","relation":{},"subject":[],"published":{"date-parts":[[2011,4]]}}}