{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,4,23]],"date-time":"2025-04-23T05:49:31Z","timestamp":1745387371721,"version":"3.28.0"},"reference-count":6,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2011,4]]},"DOI":"10.1109\/ddecs.2011.5783051","type":"proceedings-article","created":{"date-parts":[[2011,6,7]],"date-time":"2011-06-07T17:09:21Z","timestamp":1307466561000},"page":"75-79","source":"Crossref","is-referenced-by-count":8,"title":["A resistorless current reference source for 65 nm CMOS technology with low sensitivity to process, supply voltage and temperature variations"],"prefix":"10.1109","author":[{"given":"Michal","family":"Lukaszewicz","sequence":"first","affiliation":[]},{"given":"Tomasz","family":"Borejko","sequence":"additional","affiliation":[]},{"given":"Witold A.","family":"Pleskacz","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1049\/el:20072528"},{"key":"ref3","first-page":"600","article-title":"All CMOS Temperature, Supply Voltage and Process Independent Current Reference","author":"yi","year":"2007","journal-title":"7th International Conference on ASIC"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/MWSCAS.2002.1187209"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TCSI.2007.900176"},{"key":"ref2","article-title":"A 1?W 600-ppm\/°C Current Reference Circuit Consisting of Subtreshold CMOS Circuits","volume":"57","author":"ueno","year":"2010","journal-title":"IEEE Transaction on Circuits and Systems-II Express Briefs"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2010.5537432"}],"event":{"name":"Systems (DDECS)","start":{"date-parts":[[2011,4,13]]},"location":"Cottbus, Germany","end":{"date-parts":[[2011,4,15]]}},"container-title":["14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5771301\/5783023\/05783051.pdf?arnumber=5783051","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,21]],"date-time":"2017-03-21T06:38:59Z","timestamp":1490078339000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5783051\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2011,4]]},"references-count":6,"URL":"https:\/\/doi.org\/10.1109\/ddecs.2011.5783051","relation":{},"subject":[],"published":{"date-parts":[[2011,4]]}}}