{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,6]],"date-time":"2024-09-06T02:32:05Z","timestamp":1725589925458},"reference-count":6,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2011,4]]},"DOI":"10.1109\/ddecs.2011.5783109","type":"proceedings-article","created":{"date-parts":[[2011,6,7]],"date-time":"2011-06-07T17:09:21Z","timestamp":1307466561000},"page":"347-352","source":"Crossref","is-referenced-by-count":8,"title":["Optimized embedded memory diagnosis"],"prefix":"10.1109","author":[{"given":"M. de","family":"Carvalho","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"P.","family":"Bernardi","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"M. Sonza","family":"Reorda","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"N.","family":"Campanelli","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"T.","family":"Kerekes","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"D.","family":"Appello","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"M.","family":"Barone","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"V.","family":"Tancorre","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"M.","family":"Terzi","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","first-page":"305","article-title":"Diagnostic testing of embedded memories using BIST","author":"bergfeld","year":"2000","journal-title":"IEEE Int Conf Design Automation and Test Europe"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/54.211525"},{"article-title":"Testing Semiconductor memories: Theory and Practice","year":"1998","author":"van de goor","key":"ref6"},{"key":"ref5","first-page":"255","article-title":"Cumulative Embedded Memory Failure Bitmap Display and Analysis","author":"appello","year":"2010","journal-title":"13th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2005.1584083"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2003.1270861"}],"event":{"name":"Systems (DDECS)","start":{"date-parts":[[2011,4,13]]},"location":"Cottbus, Germany","end":{"date-parts":[[2011,4,15]]}},"container-title":["14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5771301\/5783023\/05783109.pdf?arnumber=5783109","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,21]],"date-time":"2017-03-21T09:25:27Z","timestamp":1490088327000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5783109\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2011,4]]},"references-count":6,"URL":"https:\/\/doi.org\/10.1109\/ddecs.2011.5783109","relation":{},"subject":[],"published":{"date-parts":[[2011,4]]}}}