{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T06:22:38Z","timestamp":1725430958374},"reference-count":19,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2011,4]]},"DOI":"10.1109\/ddecs.2011.5783115","type":"proceedings-article","created":{"date-parts":[[2011,6,7]],"date-time":"2011-06-07T13:09:21Z","timestamp":1307452161000},"page":"381-386","source":"Crossref","is-referenced-by-count":1,"title":["Measurement point selection for in-operation wear-out monitoring"],"prefix":"10.1109","author":[{"given":"Urban","family":"Ingelsson","sequence":"first","affiliation":[]},{"given":"Shih-Yen","family":"Chang","sequence":"additional","affiliation":[]},{"given":"Erik","family":"Larsson","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/DSN.2010.5544916"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2008.4700619"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2010.5457131"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/MICRO.2007.35"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2009.56"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1063\/1.322590"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1145\/1403375.1403590"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/ASICON.2009.5351352"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2009.64"},{"year":"2011","key":"ref19"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/FTCS.1993.627335"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/S0026-2714(00)00138-4"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1063\/1.372452"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1063\/1.364454"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1063\/1.1288019"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1063\/1.1475354"},{"key":"ref2","first-page":"581","article-title":"Effects of cap layer and grain structure on electromigration reliability of Cu\/low-k intercconects for 45nm technology node","author":"zhang","year":"2010","journal-title":"Proc Int Reliability Physics Symp (IRPS)"},{"key":"ref1","doi-asserted-by":"crossref","first-page":"148","DOI":"10.1109\/IRPS.1967.362408","article-title":"Mass transport of aluminum by momentum exchange with conducting electrons","author":"black","year":"1967","journal-title":"28th Annual Proceedings on Reliability Physics Symposium"},{"key":"ref9","first-page":"10","article-title":"In-situ Sensors for Product Reliability Monitoring","author":"mishra","year":"2002","journal-title":"Design test integration and packing of MEMSIMOEMS"}],"event":{"name":"Systems (DDECS)","start":{"date-parts":[[2011,4,13]]},"location":"Cottbus, Germany","end":{"date-parts":[[2011,4,15]]}},"container-title":["14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/5771301\/5783023\/05783115.pdf?arnumber=5783115","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2019,6,11]],"date-time":"2019-06-11T09:37:32Z","timestamp":1560245852000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/5783115\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2011,4]]},"references-count":19,"URL":"https:\/\/doi.org\/10.1109\/ddecs.2011.5783115","relation":{},"subject":[],"published":{"date-parts":[[2011,4]]}}}