{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,10,27]],"date-time":"2025-10-27T15:22:44Z","timestamp":1761578564509},"reference-count":16,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2012,4]]},"DOI":"10.1109\/ddecs.2012.6219046","type":"proceedings-article","created":{"date-parts":[[2012,6,22]],"date-time":"2012-06-22T23:29:31Z","timestamp":1340407771000},"page":"167-170","source":"Crossref","is-referenced-by-count":3,"title":["Application of I<inf>DDT<\/inf> test towards increasing SRAM reliability in nanometer technologies"],"prefix":"10.1109","author":[{"given":"Gabor","family":"Gyepes","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Daniel","family":"Arbet","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Juraj","family":"Brenkus","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Viera","family":"Stopjakova","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"15","first-page":"91","article-title":"Application of IDDT test towards increasing SRAM reliability in nanometer technologies","author":"gyepes","year":"2011","journal-title":"PAD"},{"journal-title":"Advances in Electronic Testing Challenges and Methodologies","year":"2006","author":"gizopoulos","key":"16"},{"key":"13","first-page":"27","article-title":"Efficiency of dynamic supply current testing in detecting open defects and gate oxide shorts in static RAM cells","author":"gyepes","year":"2010","journal-title":"PAD"},{"key":"14","doi-asserted-by":"publisher","DOI":"10.1109\/DDECS.2011.5783118"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1109\/IDT.2011.6123101"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.4218\/etrij.01.0101.0205"},{"key":"3","first-page":"1","article-title":"Test requirements for today's and future circuits: A perspective","author":"manhaeve","year":"2005","journal-title":"Proc Electronics Circuits Syst"},{"key":"2","doi-asserted-by":"crossref","DOI":"10.1007\/978-1-4020-8363-1","author":"pavlov","year":"2008","journal-title":"CMOS SRAM Circuit Design and Parametric Test in Nano-Scaled Technologies"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1007\/0-387-46547-2"},{"key":"10","first-page":"367","article-title":"Power supply current detectability of SRAM defects","author":"liu","year":"1995","journal-title":"Proceedings of the Fourth Asian Test Symposium"},{"key":"7","first-page":"57","article-title":"SRAM test using on-chip dynamic power supply current sensor","author":"liu","year":"1998","journal-title":"Proc Int Workshop Memory Technol Des and Test"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/ICVD.2004.1260969"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2004.75"},{"key":"4","first-page":"857","article-title":"Resistive-open defect injection in SRAM core-cell: Analysis and comparison between 0.13 ?m and 90nm technologies","author":"dilillo","year":"2005","journal-title":"Design Automation Conference"},{"key":"9","first-page":"348","article-title":"Dynamic power supply current testing of CMOS SRAMs","author":"liu","year":"1998","journal-title":"Proc Seventh Asian Test Symp"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1049\/ip-cds:20010337"}],"event":{"name":"2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)","start":{"date-parts":[[2012,4,18]]},"location":"Tallinn, Estonia","end":{"date-parts":[[2012,4,20]]}},"container-title":["2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/6213418\/6219000\/06219046.pdf?arnumber=6219046","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,20]],"date-time":"2017-06-20T20:27:56Z","timestamp":1497990476000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6219046\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2012,4]]},"references-count":16,"URL":"https:\/\/doi.org\/10.1109\/ddecs.2012.6219046","relation":{},"subject":[],"published":{"date-parts":[[2012,4]]}}}