{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,5,21]],"date-time":"2025-05-21T06:56:31Z","timestamp":1747810591664},"reference-count":14,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2012,4]]},"DOI":"10.1109\/ddecs.2012.6219084","type":"proceedings-article","created":{"date-parts":[[2012,6,22]],"date-time":"2012-06-22T19:29:31Z","timestamp":1340393371000},"page":"336-341","source":"Crossref","is-referenced-by-count":3,"title":["Test platform for fault tolerant systems design properties verification"],"prefix":"10.1109","author":[{"given":"Martin","family":"Straka","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Lukas","family":"Miculka","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jan","family":"Kastil","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Zdenek","family":"Kotasek","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"13","article-title":"Fault tolerant structure for srambased fpga via partial dynamic reconfiguration","author":"straka","year":"2010","journal-title":"13th EUROMICRO Conference on Digital System Design DSD 2010"},{"key":"14","doi-asserted-by":"publisher","DOI":"10.1109\/DSD.2011.32"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS.2006.5"},{"key":"12","doi-asserted-by":"crossref","first-page":"607","DOI":"10.1007\/3-540-46117-5_63","article-title":"Simulation-based analysis of seu effects on sram-based fpgas","author":"rebaudengo","year":"2002","journal-title":"Proceedings of the Reconfigurable Computing Is Going Mainstream 12th International Conference on Field-Programmable Logic and Applications"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/DSD.2009.150"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/DFT.2007.25"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1145\/1142155.1142167"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2003.821791"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1145\/1403375.1403456"},{"journal-title":"Reconfigurable Field Programmable Gate Arrays for Mission-Critical Applications","year":"2010","author":"battezzati","key":"6"},{"key":"5","article-title":"Fault-tolerance techniques for sram-based fpgas, ser","author":"kastensmidt","year":"2006","journal-title":"Frontiers in Electronic Testing"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1145\/1228784.1228803"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/FPL.2009.5272410"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/MSE.2007.81"}],"event":{"name":"2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)","start":{"date-parts":[[2012,4,18]]},"location":"Tallinn, Estonia","end":{"date-parts":[[2012,4,20]]}},"container-title":["2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/6213418\/6219000\/06219084.pdf?arnumber=6219084","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,20]],"date-time":"2017-06-20T16:27:57Z","timestamp":1497976077000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6219084\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2012,4]]},"references-count":14,"URL":"https:\/\/doi.org\/10.1109\/ddecs.2012.6219084","relation":{},"subject":[],"published":{"date-parts":[[2012,4]]}}}