{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,5,22]],"date-time":"2025-05-22T04:08:40Z","timestamp":1747886920245,"version":"3.41.0"},"reference-count":14,"publisher":"IEEE","license":[{"start":{"date-parts":[[2012,4,1]],"date-time":"2012-04-01T00:00:00Z","timestamp":1333238400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2012,4,1]],"date-time":"2012-04-01T00:00:00Z","timestamp":1333238400000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2012,4]]},"DOI":"10.1109\/ddecs.2012.6219089","type":"proceedings-article","created":{"date-parts":[[2012,6,22]],"date-time":"2012-06-22T23:29:31Z","timestamp":1340407771000},"page":"366-371","source":"Crossref","is-referenced-by-count":7,"title":["Reconfigurable time interval measurement circuit incorporating a programmable gain time difference amplifier"],"prefix":"10.1109","author":[{"given":"A. N. M.","family":"Alahmadi","sequence":"first","affiliation":[{"name":"School of Electrical, Electronic and Computer Engineering, Newcastle University, Newcastle upon Tyne, United Kingdom"}]},{"given":"G.","family":"Russell","sequence":"additional","affiliation":[{"name":"School of Electrical, Electronic and Computer Engineering, Newcastle University, Newcastle upon Tyne, United Kingdom"}]},{"given":"A.","family":"Yakovlev","sequence":"additional","affiliation":[{"name":"School of Electrical, Electronic and Computer Engineering, Newcastle University, Newcastle upon Tyne, United Kingdom"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/ICECS.1998.813351"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/23.603675"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.1994.409463"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/4.406397"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1049\/el:19961149"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.2002.1012770"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/4.823449"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/ISVLSI.2005.66"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ASICON.2009.5351194"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/VLSID.2006.28"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1049\/el:20020961"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2004.1268980"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2008.917405"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1145\/1065579.1065751"}],"event":{"name":"2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)","start":{"date-parts":[[2012,4,18]]},"location":"Tallinn, Estonia","end":{"date-parts":[[2012,4,20]]}},"container-title":["2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/6213418\/6219000\/06219089.pdf?arnumber=6219089","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,5,21]],"date-time":"2025-05-21T06:25:21Z","timestamp":1747808721000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/6219089\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2012,4]]},"references-count":14,"URL":"https:\/\/doi.org\/10.1109\/ddecs.2012.6219089","relation":{},"subject":[],"published":{"date-parts":[[2012,4]]}}}