{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T13:22:39Z","timestamp":1725542559175},"reference-count":17,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2013,4]]},"DOI":"10.1109\/ddecs.2013.6549814","type":"proceedings-article","created":{"date-parts":[[2013,7,9]],"date-time":"2013-07-09T15:43:11Z","timestamp":1373384591000},"page":"187-192","source":"Crossref","is-referenced-by-count":9,"title":["On the feasibility of combining on-line-test and self repair for logic circuits"],"prefix":"10.1109","author":[{"given":"T.","family":"Koal","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"M.","family":"Ulbricht","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"P.","family":"Engelke","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"H. T.","family":"Vierhaus","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"17","doi-asserted-by":"publisher","DOI":"10.1016\/S0019-9958(61)80037-5"},{"key":"15","first-page":"204","article-title":"A theory of asynchronous circuits","author":"muller","year":"1959","journal-title":"Proc Int l Symp Theory of Switching Part II"},{"key":"16","first-page":"159","article-title":"Concurrent error detection with split-parity codes","author":"richter","year":"2009","journal-title":"Proc 15th IEEE International On-Line Testing Symposium -Rfsti"},{"key":"13","doi-asserted-by":"publisher","DOI":"10.1109\/MC.2005.70"},{"key":"14","article-title":"Combinational logic soft error correction","author":"mitra","year":"2006","journal-title":"Proc IEEE Int Test Conf"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1109\/DDECS.2010.5491808"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1109\/DDECS.2011.5783082"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/CICC.1998.695033"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2003.813129"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2005.69"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/DFT.2011.52"},{"journal-title":"Fault Tolerant Computing","year":"1996","author":"pradhan","key":"7"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/ICVD.2005.88"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2009.151"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2004.03.019"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/DDECS.2009.5012100"},{"journal-title":"Self-Checking and Fault Tolerant Digital Design","year":"2001","author":"lala","key":"8"}],"event":{"name":"2013 IEEE 16th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)","start":{"date-parts":[[2013,4,8]]},"location":"Karlovy Vary","end":{"date-parts":[[2013,4,10]]}},"container-title":["2013 IEEE 16th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6533795\/6549768\/06549814.pdf?arnumber=6549814","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,22]],"date-time":"2017-03-22T18:21:09Z","timestamp":1490206869000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6549814\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,4]]},"references-count":17,"URL":"https:\/\/doi.org\/10.1109\/ddecs.2013.6549814","relation":{},"subject":[],"published":{"date-parts":[[2013,4]]}}}