{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,4]],"date-time":"2024-09-04T15:28:39Z","timestamp":1725463719035},"reference-count":5,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2017,4]]},"DOI":"10.1109\/ddecs.2017.7934561","type":"proceedings-article","created":{"date-parts":[[2017,5,29]],"date-time":"2017-05-29T16:22:11Z","timestamp":1496074931000},"page":"22-27","source":"Crossref","is-referenced-by-count":2,"title":["Mealy-to-moore transformation"],"prefix":"10.1109","author":[{"given":"Mustafa","family":"Ozgul","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Florian","family":"Deeg","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Sebastian M.","family":"Sattler","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref4","article-title":"A Real-World Model of Partially Defined Logic","author":"uygur","year":"2016","journal-title":"International Workshop on Boolean Problems"},{"key":"ref3","first-page":"45","author":"hebisch","year":"0","journal-title":"Formale Sprache und Automatentheorie WS 13\/14"},{"key":"ref5","first-page":"498","article-title":"A New Approach for Modelling Inconsistencies in Digital-Assisted Analog Design","author":"uygur","year":"2016","journal-title":"Journal of Electronic Testing"},{"journal-title":"Eine Testfallspezifikation für das funktionsori-entierte Testen von reaktiven eingebetteten Systemen im Automobilen Bereich","year":"2011","author":"ipek","key":"ref2"},{"journal-title":"Pin-Type Based VLSI Partitioning AmE","year":"2014","author":"uygur","key":"ref1"}],"event":{"name":"2017 IEEE 20th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)","start":{"date-parts":[[2017,4,19]]},"location":"Dresden, Germany","end":{"date-parts":[[2017,4,21]]}},"container-title":["2017 IEEE 20th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7932334\/7934552\/07934561.pdf?arnumber=7934561","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,5]],"date-time":"2017-06-05T14:51:54Z","timestamp":1496674314000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7934561\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2017,4]]},"references-count":5,"URL":"https:\/\/doi.org\/10.1109\/ddecs.2017.7934561","relation":{},"subject":[],"published":{"date-parts":[[2017,4]]}}}