{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,29]],"date-time":"2024-10-29T14:58:28Z","timestamp":1730213908925,"version":"3.28.0"},"reference-count":15,"publisher":"IEEE","license":[{"start":{"date-parts":[[2020,4,1]],"date-time":"2020-04-01T00:00:00Z","timestamp":1585699200000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2020,4,1]],"date-time":"2020-04-01T00:00:00Z","timestamp":1585699200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2020,4,1]],"date-time":"2020-04-01T00:00:00Z","timestamp":1585699200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2020,4]]},"DOI":"10.1109\/ddecs50862.2020.9095565","type":"proceedings-article","created":{"date-parts":[[2020,5,19]],"date-time":"2020-05-19T21:07:10Z","timestamp":1589922430000},"page":"1-5","source":"Crossref","is-referenced-by-count":3,"title":["Quadruple voltage mixed quenching and active resetting circuit in 150 nm CMOS for an external SPAD"],"prefix":"10.1109","author":[{"given":"Alija","family":"Dervic","sequence":"first","affiliation":[]},{"given":"Bernhard","family":"Goll","sequence":"additional","affiliation":[]},{"given":"Horst","family":"Zimmermann","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/OGC.2019.8925285"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TIM.2014.2338652"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/JQE.2016.2597798"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/LPT.2018.2884740"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/ICECS46596.2019.8964689"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/JSTQE.2017.2764682"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1038\/nphoton.2007.22"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/PRIME.2011.5966247"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2010.2074213"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/LPT.2016.2572300"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2002.803045"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.1989.100659"},{"key":"ref2","article-title":"Single-photon imaging in complementary metal oxide semiconductor processes","volume":"372","author":"chabron","year":"2014","journal-title":"Philosophical Transactions of The Royal Society A Mathematical Physical and Engineering Sciences"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2013.2284352"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1364\/OE.24.017819"}],"event":{"name":"2020 23rd International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)","start":{"date-parts":[[2020,4,22]]},"location":"Novi Sad, Serbia","end":{"date-parts":[[2020,4,24]]}},"container-title":["2020 23rd International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9093721\/9095556\/09095565.pdf?arnumber=9095565","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,6,27]],"date-time":"2022-06-27T16:06:52Z","timestamp":1656346012000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9095565\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2020,4]]},"references-count":15,"URL":"https:\/\/doi.org\/10.1109\/ddecs50862.2020.9095565","relation":{},"subject":[],"published":{"date-parts":[[2020,4]]}}}