{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,2,21]],"date-time":"2025-02-21T01:06:23Z","timestamp":1740099983551,"version":"3.37.3"},"reference-count":8,"publisher":"IEEE","license":[{"start":{"date-parts":[[2021,4,7]],"date-time":"2021-04-07T00:00:00Z","timestamp":1617753600000},"content-version":"vor","delay-in-days":0,"URL":"https:\/\/ieeexplore.ieee.org\/Xplorehelp\/downloads\/license-information\/IEEE.html"},{"start":{"date-parts":[[2021,4,7]],"date-time":"2021-04-07T00:00:00Z","timestamp":1617753600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2021,4,7]],"date-time":"2021-04-07T00:00:00Z","timestamp":1617753600000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100004347","name":"STMicroelectronics","doi-asserted-by":"publisher","id":[{"id":"10.13039\/501100004347","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2021,4,7]]},"DOI":"10.1109\/ddecs52668.2021.9417073","type":"proceedings-article","created":{"date-parts":[[2021,4,30]],"date-time":"2021-04-30T20:25:43Z","timestamp":1619814343000},"page":"87-92","source":"Crossref","is-referenced-by-count":2,"title":["Prevention and Detection Methods of Systematic Failures in the Implementation of SoC Safety Mechanisms not Covered by Regular Functional Tests"],"prefix":"10.1109","author":[{"given":"Denis","family":"Dutey","sequence":"first","affiliation":[]},{"given":"Stephane","family":"Martin","sequence":"additional","affiliation":[]},{"given":"Anne","family":"Merlande","sequence":"additional","affiliation":[]},{"given":"Om","family":"Ranjan","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"journal-title":"Synopsys","article-title":"Functional Safety Implementation Goes Mainstream","year":"0","key":"ref4"},{"journal-title":"ISO26262-11-2018 section 5 1 9 &#x2018;Example of techniques or measures to detect or avoid systematic failures during design of a digital component","year":"0","key":"ref3"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2014.2387391"},{"key":"ref5","first-page":"32","article-title":"Soft-error analysis for functional safety","author":"synopsys","year":"0","journal-title":"SNUG (Synopsys Users Group) Silicon Valley"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.3850\/9783981537079_0405"},{"journal-title":"Modulated Clock Synchronizer","year":"2015","author":"jacquet","key":"ref7"},{"journal-title":"ISO26262-8-2018 section 13 &#x2018;Evaluation of hardware elements&#x2019;","year":"0","key":"ref2"},{"journal-title":"International Organization for Standardization 2018-12 Following parts are relevant in the scope of this paper Part5 &#x2018;Product development at the hardware level&#x2019; Part8 &#x2018;Supporting processes&#x2019; Part10 &#x2018;Guidelines on ISO 26262&#x2019; Part11 &#x2018;Guidelines on application of ISO26262 to semiconductors","article-title":"Road vehicles &#x2013; Functional safety","year":"0","key":"ref1"}],"event":{"name":"2021 24th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)","start":{"date-parts":[[2021,4,7]]},"location":"Vienna, Austria","end":{"date-parts":[[2021,4,9]]}},"container-title":["2021 24th International Symposium on Design and Diagnostics of Electronic Circuits &amp; Systems (DDECS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/9417028\/9417018\/09417073.pdf?arnumber=9417073","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2022,5,10]],"date-time":"2022-05-10T15:41:12Z","timestamp":1652197272000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/9417073\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2021,4,7]]},"references-count":8,"URL":"https:\/\/doi.org\/10.1109\/ddecs52668.2021.9417073","relation":{},"subject":[],"published":{"date-parts":[[2021,4,7]]}}}