{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,6,25]],"date-time":"2026-06-25T21:56:09Z","timestamp":1782424569721,"version":"3.54.5"},"reference-count":14,"publisher":"IEEE","license":[{"start":{"date-parts":[[2023,5,3]],"date-time":"2023-05-03T00:00:00Z","timestamp":1683072000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2023,5,3]],"date-time":"2023-05-03T00:00:00Z","timestamp":1683072000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2023,5,3]]},"DOI":"10.1109\/ddecs57882.2023.10139468","type":"proceedings-article","created":{"date-parts":[[2023,6,2]],"date-time":"2023-06-02T19:34:34Z","timestamp":1685734474000},"page":"124-127","source":"Crossref","is-referenced-by-count":14,"title":["APPRAISER: DNN Fault Resilience Analysis Employing Approximation Errors"],"prefix":"10.1109","author":[{"given":"Mahdi","family":"Taheri","sequence":"first","affiliation":[{"name":"Tallinn University of Technology,Tallinn,Estonia"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Mohammad Hasan","family":"Ahmadilivani","sequence":"additional","affiliation":[{"name":"Tallinn University of Technology,Tallinn,Estonia"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Maksim","family":"Jenihhin","sequence":"additional","affiliation":[{"name":"Tallinn University of Technology,Tallinn,Estonia"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Masoud","family":"Daneshtalab","sequence":"additional","affiliation":[{"name":"Tallinn University of Technology,Tallinn,Estonia"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Jaan","family":"Raik","sequence":"additional","affiliation":[{"name":"Tallinn University of Technology,Tallinn,Estonia"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TVLSI.2019.2940943"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.23919\/DATE.2017.7926993"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2009.5090716"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED57927.2023.10129353"},{"key":"ref10","article-title":"Algorithm-based fault tolerance at scale","author":"booth","year":"2022"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/IVS.2017.7995703"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1038\/nature24270"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/DAC18072.2020.9218697"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/ISQED48828.2020.9137006"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ICMLA51294.2020.00183"},{"key":"ref4","article-title":"Deep learning-based vehicle behavior prediction for autonomous driving applications: A review","author":"mozaffari","year":"2020","journal-title":"IEEE T-ITS"},{"key":"ref3","article-title":"Dnn hardware reliability assessment and enhancement","author":"taheri","year":"2022","journal-title":"IEEE European Test Symposium (ETS)"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/2.585157"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2020.113969"}],"event":{"name":"2023 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)","location":"Tallinn, Estonia","start":{"date-parts":[[2023,5,3]]},"end":{"date-parts":[[2023,5,5]]}},"container-title":["2023 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/10139314\/10138940\/10139468.pdf?arnumber=10139468","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2023,6,19]],"date-time":"2023-06-19T17:49:09Z","timestamp":1687196949000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/10139468\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2023,5,3]]},"references-count":14,"URL":"https:\/\/doi.org\/10.1109\/ddecs57882.2023.10139468","relation":{},"subject":[],"published":{"date-parts":[[2023,5,3]]}}}