{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,4,5]],"date-time":"2026-04-05T10:20:31Z","timestamp":1775384431891,"version":"3.50.1"},"reference-count":15,"publisher":"IEEE","license":[{"start":{"date-parts":[[2025,5,5]],"date-time":"2025-05-05T00:00:00Z","timestamp":1746403200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2025,5,5]],"date-time":"2025-05-05T00:00:00Z","timestamp":1746403200000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/100010002","name":"Ministry of Education","doi-asserted-by":"publisher","id":[{"id":"10.13039\/100010002","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2025,5,5]]},"DOI":"10.1109\/ddecs63720.2025.11006682","type":"proceedings-article","created":{"date-parts":[[2025,5,21]],"date-time":"2025-05-21T17:37:05Z","timestamp":1747849025000},"page":"19-24","source":"Crossref","is-referenced-by-count":1,"title":["Towards an Automated Debugging Approach for Fault Identification in Quantum Circuits"],"prefix":"10.1109","author":[{"given":"Anton","family":"Maidl","sequence":"first","affiliation":[{"name":"German Aerospace Center (DLR e.V.),Institute for the Protection of Maritime Infrastructure,Bremerhaven,Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Abhoy","family":"Kole","sequence":"additional","affiliation":[{"name":"DFKI GmbH,Cyber-Physical Systems,Bremen,Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Kamalika","family":"Datta","sequence":"additional","affiliation":[{"name":"University of Bremen,Institute of Computer Science,Bremen,Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jannis","family":"Stoppe","sequence":"additional","affiliation":[{"name":"German Aerospace Center (DLR e.V.),Institute for the Protection of Maritime Infrastructure,Bremerhaven,Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Rolf","family":"Drechsler","sequence":"additional","affiliation":[{"name":"University of Bremen,Institute of Computer Science,Bremen,Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1201\/9780429500459-11"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1126\/science.1113479"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1016\/j.revip.2019.100028"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/SFCS.1994.365700"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1145\/237814.237866"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1088\/2058-9565\/aab822"},{"key":"ref7","first-page":"541","article-title":"Statistical assertions for validating patterns and finding bugs in quantum programs","volume-title":"Proceedings of the 46th International Symposium on Computer Architecture, ser. ISCA \u201919","author":"Huang"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1145\/3428218"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1017\/cbo9780511976667"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1145\/3591270"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2018.2834427"},{"key":"ref12","article-title":"Cirquo: A suite for testing and debugging quantum programs","author":"Metwalli","year":"2023"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1145\/3639476.3639761"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1017\/CBO9780511810817"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1137\/S0097539796300921"}],"event":{"name":"2025 IEEE 28th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)","location":"Lyon, France","start":{"date-parts":[[2025,5,5]]},"end":{"date-parts":[[2025,5,7]]}},"container-title":["2025 IEEE 28th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/11006671\/11006672\/11006682.pdf?arnumber=11006682","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2025,5,22]],"date-time":"2025-05-22T05:46:33Z","timestamp":1747892793000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11006682\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2025,5,5]]},"references-count":15,"URL":"https:\/\/doi.org\/10.1109\/ddecs63720.2025.11006682","relation":{},"subject":[],"published":{"date-parts":[[2025,5,5]]}}}