{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,5,20]],"date-time":"2026-05-20T05:12:02Z","timestamp":1779253922937,"version":"3.51.4"},"reference-count":24,"publisher":"IEEE","license":[{"start":{"date-parts":[[2026,4,27]],"date-time":"2026-04-27T00:00:00Z","timestamp":1777248000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2026,4,27]],"date-time":"2026-04-27T00:00:00Z","timestamp":1777248000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2026,4,27]]},"DOI":"10.1109\/ddecs69233.2026.11520974","type":"proceedings-article","created":{"date-parts":[[2026,5,19]],"date-time":"2026-05-19T19:47:47Z","timestamp":1779220067000},"page":"1-6","source":"Crossref","is-referenced-by-count":0,"title":["On-Chip Sensor with Programmable Delay Logic to Monitor Memory Aging Evolution"],"prefix":"10.1109","author":[{"given":"Fabian","family":"Vargas","sequence":"first","affiliation":[{"name":"IHP, Leibniz-Institut für innovative Mikroelektronik,Frankfurt Oder,Germany"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Vache","family":"Galstyan","sequence":"additional","affiliation":[{"name":"HAT, TPG Synopsys,Yerevan,Armenia"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Gurgen","family":"Harutyunyan","sequence":"additional","affiliation":[{"name":"HAT, TPG Synopsys,Yerevan,Armenia"}],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Yervant","family":"Zorian","sequence":"additional","affiliation":[{"name":"HAT, TPG Synopsys,Sunnyvale,USA"}],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2020.113884"},{"issue":"4","key":"ref2","first-page":"421","article-title":"Modeling the Effect of Process, Power-Supply Voltage and Temperature Variations on the Timing Response of Nanometer Digital Circuits","volume-title":"JETTA","volume":"28","author":"Freijedo","year":"2012"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/latw.2011.5985926"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/tnano.2013.2253795"},{"key":"ref5","doi-asserted-by":"crossref","first-page":"159","DOI":"10.1007\/s10836-014-5444-x","article-title":"An OnChip Sensor to Monitor NBTI Effects in SRAMs","volume":"30","author":"Ceratti","year":"2014","journal-title":"J Electron Test"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/aspdac.2017.7858316"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/fpl.2011.66"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2010.04.024"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/ddecs.2012.6219087"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/iolts.2013.6604046"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/dcis.2016.7845354"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/dcis53048.2021.9666163"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/test.2007.4437590"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/JSSC.2011.2164300"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2012.6231082"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/IMS3TW.2010.5503006"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/lats62223.2024.10534623"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/VTS56346.2023.10140110"},{"key":"ref19","volume-title":"JESD22-A108 Std","year":"2026"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/rpic.2019.8882166"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/cae.2019.8709295"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/iolts60994.2024.10616091"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1109\/ICECS58634.2023.10382776"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1016\/j.mejo.2012.01.004"}],"event":{"name":"2026 IEEE 29th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)","location":"Bratislava, Slovakia","start":{"date-parts":[[2026,4,27]]},"end":{"date-parts":[[2026,4,29]]}},"container-title":["2026 IEEE 29th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/11520920\/11520973\/11520974.pdf?arnumber=11520974","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,5,20]],"date-time":"2026-05-20T05:03:29Z","timestamp":1779253409000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11520974\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,4,27]]},"references-count":24,"URL":"https:\/\/doi.org\/10.1109\/ddecs69233.2026.11520974","relation":{},"subject":[],"published":{"date-parts":[[2026,4,27]]}}}