{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2026,7,11]],"date-time":"2026-07-11T17:23:05Z","timestamp":1783790585081,"version":"3.55.0"},"reference-count":25,"publisher":"IEEE","license":[{"start":{"date-parts":[[2026,4,27]],"date-time":"2026-04-27T00:00:00Z","timestamp":1777248000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-029"},{"start":{"date-parts":[[2026,4,27]],"date-time":"2026-04-27T00:00:00Z","timestamp":1777248000000},"content-version":"stm-asf","delay-in-days":0,"URL":"https:\/\/doi.org\/10.15223\/policy-037"}],"funder":[{"DOI":"10.13039\/501100002347","name":"Federal Ministry of Education and Research","doi-asserted-by":"publisher","award":["16KIS1695"],"award-info":[{"award-number":["16KIS1695"]}],"id":[{"id":"10.13039\/501100002347","id-type":"DOI","asserted-by":"publisher"}]},{"DOI":"10.13039\/100004807","name":"DFG","doi-asserted-by":"publisher","award":["47183717"],"award-info":[{"award-number":["47183717"]}],"id":[{"id":"10.13039\/100004807","id-type":"DOI","asserted-by":"publisher"}]}],"content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2026,4,27]]},"DOI":"10.1109\/ddecs69233.2026.11520991","type":"proceedings-article","created":{"date-parts":[[2026,5,19]],"date-time":"2026-05-19T19:47:47Z","timestamp":1779220067000},"page":"1-5","source":"Crossref","is-referenced-by-count":1,"title":["Ageing Monitoring for Commercial Microcontrollers Based on Timing Windows"],"prefix":"10.1109","author":[{"given":"Leandro","family":"Lanzieri","sequence":"first","affiliation":[{"name":"Deutsches Elektronen-Synchrotron DESY,Hamburg,Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Jiri","family":"Kral","sequence":"additional","affiliation":[{"name":"Deutsches Elektronen-Synchrotron DESY,Hamburg,Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Goerschwin","family":"Fey","sequence":"additional","affiliation":[{"name":"Hamburg University of Technology,Hamburg,Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Holger","family":"Schlarb","sequence":"additional","affiliation":[{"name":"Deutsches Elektronen-Synchrotron DESY,Hamburg,Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]},{"given":"Thomas C.","family":"Schmidt","sequence":"additional","affiliation":[{"name":"Hamburg University of Applied Sciences,Hamburg,Germany"}],"role":[{"vocabulary":"crossref","role":"author"}]}],"member":"263","reference":[{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/DSD64264.2024.00018"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/DSD60849.2023.00054"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1007\/978-981-16-8862-1_21"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1145\/3695247"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/jssc.2019.2951692"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/EMCCompo61192.2024.10742051"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/DDECS57882.2023.10139623"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/MDT.2010.5"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/INDIN.2007.4384745"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2004.839486"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2003.1253736"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2006.10.006"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2019.2916869"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/LATW.2017.7906756"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.21608\/asat.2017.22762"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2014.2368125"},{"key":"ref17","article-title":"IEC 60730\u20131 - Automatic electrical controls - General requirements","year":"2022","journal-title":"International Electrotechnical Commission, Tech. Rep."},{"key":"ref18","article-title":"March-based ram diagnosis algorithms for stuck-at and coupling faults","volume-title":"Int. Test Conf.","author":"Li","year":"2001"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/ARES.2009.169"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1145\/2885500"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1007\/978-1-4614-0748-5"},{"key":"ref22","volume-title":"Physics of Semiconductor Devices","author":"Sze","year":"2007"},{"key":"ref23","doi-asserted-by":"publisher","DOI":"10.1016\/0038-1101(92)90326-8"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1109\/ISCAS.2006.1693470"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1145\/775832.775920"}],"event":{"name":"2026 IEEE 29th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)","location":"Bratislava, Slovakia","start":{"date-parts":[[2026,4,27]]},"end":{"date-parts":[[2026,4,29]]}},"container-title":["2026 IEEE 29th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx8\/11520920\/11520973\/11520991.pdf?arnumber=11520991","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2026,5,20]],"date-time":"2026-05-20T04:56:30Z","timestamp":1779252990000},"score":1,"resource":{"primary":{"URL":"https:\/\/ieeexplore.ieee.org\/document\/11520991\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2026,4,27]]},"references-count":25,"URL":"https:\/\/doi.org\/10.1109\/ddecs69233.2026.11520991","relation":{},"subject":[],"published":{"date-parts":[[2026,4,27]]}}}