{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,9,5]],"date-time":"2024-09-05T11:10:39Z","timestamp":1725534639436},"reference-count":6,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2012,10]]},"DOI":"10.1109\/dft.2012.6378200","type":"proceedings-article","created":{"date-parts":[[2012,12,18]],"date-time":"2012-12-18T21:51:04Z","timestamp":1355867464000},"page":"59-62","source":"Crossref","is-referenced-by-count":1,"title":["Minimization of Trojan footprint by reducing Delay\/Area impact"],"prefix":"10.1109","author":[{"given":"Mehryar","family":"Rahmatian","sequence":"first","affiliation":[]},{"given":"Hessam","family":"Kooti","sequence":"additional","affiliation":[]},{"given":"Ian G.","family":"Harris","sequence":"additional","affiliation":[]},{"given":"Elaheh","family":"Bozorgzadeh","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"3","first-page":"1362","article-title":"Towards trojan-free trusted ics: Problem analysis and detection scheme","author":"papachristou","year":"2008","journal-title":"Design Automation and Test in Europe"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/MC.2010.299"},{"key":"1","first-page":"15","article-title":"Detecting malicious inclusions in secure hardware","author":"tehranipoor","year":"0","journal-title":"2008 IEEE International Workshop on Hardware-Oriented Security and Trust"},{"key":"6","first-page":"105","article-title":"Design and analysis of ring oscillator based design-for-trust technique","author":"jyothi","year":"0","journal-title":"IEEE VLSI Test Symposium 2011"},{"key":"5","first-page":"51","article-title":"Hardware trojan detection using path delay fingerprint","author":"jin","year":"2008","journal-title":"n Hardware-Oriented Security and Trust"},{"key":"4","first-page":"296","article-title":"Trojan detection using ic fingerprinting","author":"baktir","year":"2007","journal-title":"Security and Privacy"}],"event":{"name":"2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","start":{"date-parts":[[2012,10,3]]},"location":"Austin, TX, USA","end":{"date-parts":[[2012,10,5]]}},"container-title":["2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/6362314\/6378188\/06378200.pdf?arnumber=6378200","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,22]],"date-time":"2017-03-22T02:37:41Z","timestamp":1490150261000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6378200\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2012,10]]},"references-count":6,"URL":"https:\/\/doi.org\/10.1109\/dft.2012.6378200","relation":{},"subject":[],"published":{"date-parts":[[2012,10]]}}}