{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,22]],"date-time":"2024-10-22T17:28:09Z","timestamp":1729618089457,"version":"3.28.0"},"reference-count":24,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2012,10]]},"DOI":"10.1109\/dft.2012.6378214","type":"proceedings-article","created":{"date-parts":[[2012,12,18]],"date-time":"2012-12-18T16:51:04Z","timestamp":1355849464000},"page":"140-145","source":"Crossref","is-referenced-by-count":7,"title":["Prediction of gate delay variation for CNFET under CNT density variation"],"prefix":"10.1109","author":[{"given":"Ali Arabi M.","family":"Shahi","sequence":"first","affiliation":[]},{"given":"Payman","family":"Zarkesh-Ha","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"19","doi-asserted-by":"publisher","DOI":"10.1109\/TNANO.2009.2016562"},{"key":"22","doi-asserted-by":"publisher","DOI":"10.1109\/4.982424"},{"key":"17","doi-asserted-by":"crossref","first-page":"974","DOI":"10.1126\/science.1133781","article-title":"Selective Etching of Metallic Carbon Nanotubes by Gas-Phase Reaction","volume":"314","author":"zhang","year":"2006","journal-title":"Science"},{"key":"23","first-page":"252","article-title":"Effect of variability in SWCNT-based logic gates","author":"shahidipour","year":"2009","journal-title":"Integrated Circuits ISIC '09 Proceedings of the 2009 12th International Symposium on"},{"key":"18","doi-asserted-by":"publisher","DOI":"10.1038\/nnano.2007.77"},{"year":"0","key":"24"},{"key":"15","doi-asserted-by":"crossref","first-page":"706","DOI":"10.1126\/science.1058782","article-title":"Engineering Carbon Nanotubes and Nanotube Circuits Using Electrical Breakdown","volume":"292","author":"collins","year":"2001","journal-title":"Science"},{"key":"16","doi-asserted-by":"publisher","DOI":"10.1126\/science.1086534"},{"key":"13","doi-asserted-by":"publisher","DOI":"10.1145\/1837274.1837497"},{"key":"14","doi-asserted-by":"publisher","DOI":"10.1109\/TNANO.2008.2006903"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1145\/1629911.1629933"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2007.901882"},{"journal-title":"Introduction to Probability Models","year":"2010","author":"ross","key":"21"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1021\/nl035185x"},{"journal-title":"CMOS VLSI Design","year":"2004","author":"weste","key":"20"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1021\/nl034700o"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1103\/PhysRevLett.84.2941"},{"journal-title":"Variation-Aware Design of Carbon Nanotube Digital VLSI Circuits","year":"2011","author":"zhang","key":"10"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/IEDM.2011.6131490"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2007.909043"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2007.909030"},{"key":"4","doi-asserted-by":"crossref","first-page":"1319","DOI":"10.1021\/nl049222b","article-title":"Self-aligned ballistic molecular transistors and electrically parallel nanotube arrays","volume":"4","author":"javey","year":"2004","journal-title":"Nano Letters"},{"key":"9","first-page":"516","article-title":"Statistical static timing analysis technology","volume":"43","author":"nitta","year":"2007","journal-title":"FUJITSU Sci Tech J"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/TED.2010.2092780"}],"event":{"name":"2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","start":{"date-parts":[[2012,10,3]]},"location":"Austin, TX, USA","end":{"date-parts":[[2012,10,5]]}},"container-title":["2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/6362314\/6378188\/06378214.pdf?arnumber=6378214","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,21]],"date-time":"2017-06-21T00:23:10Z","timestamp":1498004590000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6378214\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2012,10]]},"references-count":24,"URL":"https:\/\/doi.org\/10.1109\/dft.2012.6378214","relation":{},"subject":[],"published":{"date-parts":[[2012,10]]}}}