{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,22]],"date-time":"2024-10-22T14:45:59Z","timestamp":1729608359472,"version":"3.28.0"},"reference-count":13,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2012,10]]},"DOI":"10.1109\/dft.2012.6378227","type":"proceedings-article","created":{"date-parts":[[2012,12,18]],"date-time":"2012-12-18T16:51:04Z","timestamp":1355849464000},"page":"217-224","source":"Crossref","is-referenced-by-count":4,"title":["Dependable routing in multi-chip NoC platforms for automotive applications"],"prefix":"10.1109","author":[{"given":"Tomohiro","family":"Yoneda","sequence":"first","affiliation":[]},{"given":"Masashi","family":"Imai","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"13","doi-asserted-by":"publisher","DOI":"10.1109\/ASYNC.2011.15"},{"key":"11","doi-asserted-by":"publisher","DOI":"10.1109\/FTCS.1993.627327"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1109\/DFT.2010.13"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/PRDC.2012.20"},{"journal-title":"Robust and Reliant Automotive Computing Environment for Future Ecars","year":"0","key":"2"},{"journal-title":"Reduced Certification Costs for Trusted Multi-core Platforms","year":"0","key":"1"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2009.5090627"},{"key":"7","doi-asserted-by":"crossref","first-page":"9","DOI":"10.1049\/ip-cdt:20000187","article-title":"fault-tolerant wormhole routing algorithm for mesh networks","volume":"147","author":"sui","year":"2000","journal-title":"Computers and Digital Techniques IEE Proceedings-"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/71.250114"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/12.589238"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/12.392844"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1016\/j.parco.2004.01.001"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/TC.2003.1228511"}],"event":{"name":"2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","start":{"date-parts":[[2012,10,3]]},"location":"Austin, TX, USA","end":{"date-parts":[[2012,10,5]]}},"container-title":["2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx5\/6362314\/6378188\/06378227.pdf?arnumber=6378227","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,21]],"date-time":"2017-06-21T00:23:10Z","timestamp":1498004590000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6378227\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2012,10]]},"references-count":13,"URL":"https:\/\/doi.org\/10.1109\/dft.2012.6378227","relation":{},"subject":[],"published":{"date-parts":[[2012,10]]}}}