{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,12,4]],"date-time":"2025-12-04T02:36:30Z","timestamp":1764815790073,"version":"3.28.0"},"reference-count":30,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2013,10]]},"DOI":"10.1109\/dft.2013.6653578","type":"proceedings-article","created":{"date-parts":[[2013,11,11]],"date-time":"2013-11-11T14:58:04Z","timestamp":1384181884000},"page":"25-32","source":"Crossref","is-referenced-by-count":12,"title":["CFEDR: Control-flow error detection and recovery using encoded signatures monitoring"],"prefix":"10.1109","author":[{"given":"Lanfang","family":"Tan","sequence":"first","affiliation":[]},{"given":"Ying","family":"Tan","sequence":"additional","affiliation":[]},{"given":"Jianjun","family":"Xu","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"key":"19","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS.2006.14"},{"key":"17","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2004.839110"},{"key":"18","doi-asserted-by":"publisher","DOI":"10.1109\/DFTVS.2003.1250158"},{"key":"15","doi-asserted-by":"publisher","DOI":"10.1049\/ip-cdt:20045103"},{"key":"16","doi-asserted-by":"publisher","DOI":"10.1109\/24.994926"},{"key":"13","doi-asserted-by":"publisher","DOI":"10.1145\/1952522.1952529"},{"key":"14","doi-asserted-by":"publisher","DOI":"10.1109\/ISCA.2005.21"},{"key":"11","first-page":"66","article-title":"Control-flow checking using branch instructions","author":"mostafa","year":"2008","journal-title":"Proc IEEE\/IFIP EUC"},{"key":"12","doi-asserted-by":"publisher","DOI":"10.1109\/FTCS.1991.146682"},{"key":"21","doi-asserted-by":"publisher","DOI":"10.1109\/CGO.2006.33"},{"key":"20","doi-asserted-by":"publisher","DOI":"10.1109\/RAMS.2005.1408426"},{"key":"22","first-page":"477","article-title":"A dynamic continuous signature monitoring technique for reliable microprocessors","volume":"94","author":"makoto","year":"2011","journal-title":"IEICE Trans Electronics"},{"key":"23","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2007.4437639"},{"key":"24","doi-asserted-by":"publisher","DOI":"10.1109\/PRDC.2010.10"},{"key":"25","doi-asserted-by":"publisher","DOI":"10.1109\/DFT.2006.11"},{"key":"26","first-page":"395","author":"aho","year":"1986","journal-title":"Compilers Principles Techniques and Tools"},{"key":"27","doi-asserted-by":"publisher","DOI":"10.1109\/24.994913"},{"key":"28","first-page":"66","article-title":"Error-detecting\/correcting-code-based self-checked\/ corrected\/ timed circuits","author":"bao","year":"2010","journal-title":"Proc NASA\/ESA AHS"},{"key":"29","first-page":"25","article-title":"Transient fault detection via simultaneous multithreading","author":"reinhardt","year":"2000","journal-title":"Proceedings of 27th International Symposium on Computer Architecture (IEEE Cat No RS00201) ISCA"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2003.813137"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2003.813129"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/PRDC.2007.61"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2005.853449"},{"key":"30","doi-asserted-by":"publisher","DOI":"10.1109\/ISCA.2005.21"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/OLT.2003.1214381"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/12.2145"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/TC.1987.1676899"},{"key":"4","doi-asserted-by":"publisher","DOI":"10.1109\/FTCS.1992.243569"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/PRDC.2005.7"},{"key":"8","first-page":"395","article-title":"Incorporating signature-monitoring technique in VLIW processors","author":"chen","year":"2004","journal-title":"Proc IEEE DFT"}],"event":{"name":"2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS)","start":{"date-parts":[[2013,10,2]]},"location":"New York City, NY, USA","end":{"date-parts":[[2013,10,4]]}},"container-title":["2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6644330\/6653572\/06653578.pdf?arnumber=6653578","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,22]],"date-time":"2017-03-22T21:39:35Z","timestamp":1490218775000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6653578\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,10]]},"references-count":30,"URL":"https:\/\/doi.org\/10.1109\/dft.2013.6653578","relation":{},"subject":[],"published":{"date-parts":[[2013,10]]}}}