{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,29]],"date-time":"2024-10-29T15:08:47Z","timestamp":1730214527889,"version":"3.28.0"},"reference-count":11,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2013,10]]},"DOI":"10.1109\/dft.2013.6653616","type":"proceedings-article","created":{"date-parts":[[2013,11,11]],"date-time":"2013-11-11T14:58:04Z","timestamp":1384181884000},"page":"261-265","source":"Crossref","is-referenced-by-count":1,"title":["Modeling and analysis of repair and maintenance processes in Fault Tolerant Systems"],"prefix":"10.1109","author":[{"given":"J.-Y.","family":"Hung","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"N.-J.","family":"Park","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"K.M.","family":"George","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"N.","family":"Park","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"3","first-page":"554","article-title":"Estimation of photovoltaic system reliability and performance metrics, power systems","volume":"27","author":"dhople","year":"2012","journal-title":"IEEE Transactions on"},{"key":"2","article-title":"On effective TSV repair for 3Dstacked ICs","author":"jiang","year":"2012","journal-title":"Design Automation & Test in Europe Conference & Exhibition (DATE)"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/RAMS.2012.6175440"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2012.6176686"},{"key":"7","doi-asserted-by":"publisher","DOI":"10.1109\/RAMS.2012.6175472"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1109\/RAMS.2012.6175483"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/RAMS.2012.6175422"},{"key":"4","first-page":"95","article-title":"A general imperfect repair model considering time-dependent repair effectiveness, reliability","volume":"61","author":"fuqing","year":"2012","journal-title":"IEEE Transactions on"},{"key":"9","first-page":"180","article-title":"Failure profile analysis of complex repairable systems with multiple failure modesi, reliability","volume":"61","author":"yang","year":"2012","journal-title":"IEEE Transactions on"},{"key":"8","doi-asserted-by":"publisher","DOI":"10.1109\/RAMS.2012.6175509"},{"key":"11","first-page":"1","article-title":"Availability, reliability, and component importance evaluation of various repairable substation automation systems, power delivery","volume":"pp","author":"hajian-hoseinabadi","year":"2012","journal-title":"IEEE Transactions on"}],"event":{"name":"2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS)","start":{"date-parts":[[2013,10,2]]},"location":"New York City, NY, USA","end":{"date-parts":[[2013,10,4]]}},"container-title":["2013 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6644330\/6653572\/06653616.pdf?arnumber=6653616","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,22]],"date-time":"2017-03-22T21:33:10Z","timestamp":1490218390000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6653616\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2013,10]]},"references-count":11,"URL":"https:\/\/doi.org\/10.1109\/dft.2013.6653616","relation":{},"subject":[],"published":{"date-parts":[[2013,10]]}}}