{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,5,28]],"date-time":"2025-05-28T14:48:12Z","timestamp":1748443692010,"version":"3.28.0"},"reference-count":13,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2014,10]]},"DOI":"10.1109\/dft.2014.6962064","type":"proceedings-article","created":{"date-parts":[[2014,12,1]],"date-time":"2014-12-01T23:16:22Z","timestamp":1417475782000},"page":"246-251","source":"Crossref","is-referenced-by-count":9,"title":["Machine learning-based techniques for incremental functional diagnosis: A comparative analysis"],"prefix":"10.1109","author":[{"given":"Cristiana","family":"Bolchini","sequence":"first","affiliation":[]},{"given":"Luca","family":"Cassano","sequence":"additional","affiliation":[]}],"member":"263","reference":[{"journal-title":"Open Source Computer Vision Library","year":"0","key":"13"},{"key":"11","first-page":"487","article-title":"Fast algorithms for mining association rules in large databases","author":"agrawal","year":"1994","journal-title":"Proc Int Conf Very Large Data Bases"},{"key":"12","first-page":"3","article-title":"Supervised machine learning: A review of classification techniques","volume":"31","author":"kotsiantis","year":"2007","journal-title":"Informatica"},{"key":"3","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2012.49"},{"key":"2","doi-asserted-by":"publisher","DOI":"10.1109\/ATS.2012.48"},{"key":"1","doi-asserted-by":"publisher","DOI":"10.1109\/TEST.2000.894231"},{"key":"10","doi-asserted-by":"publisher","DOI":"10.1109\/DFT.2013.6653576"},{"journal-title":"Agilent Technologies","year":"0","key":"7"},{"key":"6","doi-asserted-by":"publisher","DOI":"10.1145\/2228360.2228462"},{"key":"5","doi-asserted-by":"publisher","DOI":"10.1109\/VTS.2010.5469569"},{"key":"4","doi-asserted-by":"crossref","first-page":"723","DOI":"10.1109\/TCAD.2012.2234827","article-title":"Board-level functional fault diagnosis using artificial neural networks, support-vector machines, and weighted-majority voting","volume":"32","author":"ye","year":"2013","journal-title":"IEEE Trans Computer-Aided Design of Integrated Circuits and Systems"},{"key":"9","doi-asserted-by":"publisher","DOI":"10.1109\/DFT.2009.29"},{"key":"8","doi-asserted-by":"crossref","first-page":"1234","DOI":"10.1109\/IMTC.2004.1351288","article-title":"Bayesian fault diagnosis in large-scale measurement systems","author":"bardford","year":"2004","journal-title":"Proc Instrumentation and Measurement Technology Conf"}],"event":{"name":"2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)","start":{"date-parts":[[2014,10,1]]},"location":"Amsterdam, Netherlands","end":{"date-parts":[[2014,10,3]]}},"container-title":["2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/6942523\/6962057\/06962064.pdf?arnumber=6962064","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,23]],"date-time":"2017-06-23T01:16:35Z","timestamp":1498180595000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/6962064\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2014,10]]},"references-count":13,"URL":"https:\/\/doi.org\/10.1109\/dft.2014.6962064","relation":{},"subject":[],"published":{"date-parts":[[2014,10]]}}}