{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2024,10,22]],"date-time":"2024-10-22T23:38:23Z","timestamp":1729640303244,"version":"3.28.0"},"reference-count":31,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2015,10]]},"DOI":"10.1109\/dft.2015.7315141","type":"proceedings-article","created":{"date-parts":[[2015,11,9]],"date-time":"2015-11-09T22:49:30Z","timestamp":1447109370000},"page":"85-90","source":"Crossref","is-referenced-by-count":3,"title":["Influence of triple-well technology on laser fault injection and laser sensor efficiency"],"prefix":"10.1109","author":[{"given":"N.","family":"Borrel","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"C.","family":"Champeix","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"E.","family":"Kussener","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"W.","family":"Rahajandraibe","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"M.","family":"Lisart","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"A.","family":"Sarafianos","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"J-M.","family":"Dutertre","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref31","doi-asserted-by":"publisher","DOI":"10.1109\/IPFA.2015.7224351"},{"key":"ref30","article-title":"Electrical model of an NMOS body biased structure in triple-well technology under photoelectric laser stimulation","author":"borrel","year":"2015","journal-title":"IRPS"},{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/16.34228"},{"key":"ref11","doi-asserted-by":"crossref","first-page":"49","DOI":"10.1109\/T-ED.1985.21908","article-title":"alpha-particle-induced charge collection measurements and the effectiveness of a novel p-well protection barrier on vlsi memories","volume":"32","author":"fu","year":"1985","journal-title":"IEEE Transactions on Electron Devices"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/RELPHY.1993.283330"},{"key":"ref13","doi-asserted-by":"publisher","DOI":"10.1109\/4.910490"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2005.853451"},{"key":"ref15","first-page":"300","article-title":"SRAM SER in 90,130 and 180 nm Bulk and SOI Technologies","author":"cannon","year":"2004","journal-title":"Proc IEEE Int Rel Phys Symp IRPS"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2011.2172817"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2012.6241845"},{"key":"ref18","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2007.908147"},{"key":"ref19","doi-asserted-by":"publisher","DOI":"10.1109\/DATE.2005.54"},{"key":"ref28","doi-asserted-by":"publisher","DOI":"10.1145\/313817.313937"},{"key":"ref4","first-page":"2","article-title":"Optical fault induction attacks","author":"skorobogatov","year":"2002","journal-title":"4th International Workshop on Cryptographic Hardware and Embedded Systems ser CHES '02"},{"key":"ref27","doi-asserted-by":"publisher","DOI":"10.1109\/4.179198"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.1965.4323904"},{"key":"ref6","doi-asserted-by":"publisher","DOI":"10.1109\/MM.2006.103"},{"key":"ref29","article-title":"Characterization and simulation of a body biased structure in triple-well technology under pulsed photoelectric laser","author":"borrel","year":"2014","journal-title":"ISTFA"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2012.2188769"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2013.6532028"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2013.2255312"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/T-ED.1979.19370"},{"key":"ref9","doi-asserted-by":"crossref","first-page":"706","DOI":"10.1109\/IEDM.1984.190821","article-title":"a p-type buried layer for protection against soft errors in high density cmos static rams","author":"momose","year":"1984","journal-title":"1984 International Electron Devices Meeting"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.1975.4328188"},{"key":"ref20","doi-asserted-by":"publisher","DOI":"10.1109\/FTCS.1994.315652"},{"key":"ref22","doi-asserted-by":"publisher","DOI":"10.1109\/CCECE.2010.5575124"},{"key":"ref21","doi-asserted-by":"publisher","DOI":"10.1109\/RADECS.2007.5205469"},{"key":"ref24","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2013.07.069"},{"key":"ref23","article-title":"Experimental Validation of a Bulk Built-In Current Sensor Detecting Laser-Induced Currents","author":"champeix","year":"2015","journal-title":"IEEE International On-Line Testing Symposium"},{"key":"ref26","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2014.07.151"},{"key":"ref25","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2013.2252176"}],"event":{"name":"2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS)","start":{"date-parts":[[2015,10,12]]},"location":"Amherst, MA, USA","end":{"date-parts":[[2015,10,14]]}},"container-title":["2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7304347\/7315124\/07315141.pdf?arnumber=7315141","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,6,23]],"date-time":"2017-06-23T23:14:37Z","timestamp":1498259677000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7315141\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,10]]},"references-count":31,"URL":"https:\/\/doi.org\/10.1109\/dft.2015.7315141","relation":{},"subject":[],"published":{"date-parts":[[2015,10]]}}}