{"status":"ok","message-type":"work","message-version":"1.0.0","message":{"indexed":{"date-parts":[[2025,7,8]],"date-time":"2025-07-08T05:13:11Z","timestamp":1751951591911},"reference-count":18,"publisher":"IEEE","content-domain":{"domain":[],"crossmark-restriction":false},"short-container-title":[],"published-print":{"date-parts":[[2015,10]]},"DOI":"10.1109\/dft.2015.7315158","type":"proceedings-article","created":{"date-parts":[[2015,11,9]],"date-time":"2015-11-09T22:49:30Z","timestamp":1447109370000},"page":"177-182","source":"Crossref","is-referenced-by-count":10,"title":["SEU sensitivity and modeling using pico-second pulsed laser stimulation of a D Flip-Flop in 40 nm CMOS technology"],"prefix":"10.1109","author":[{"given":"Clement","family":"Champeix","sequence":"first","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Nicolas","family":"Borrel","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Jean-Max","family":"Dutertre","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Bruno","family":"Robisson","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Mathieu","family":"Lisart","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]},{"given":"Alexandre","family":"Sarafianos","sequence":"additional","affiliation":[],"role":[{"role":"author","vocabulary":"crossref"}]}],"member":"263","reference":[{"key":"ref10","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2013.6532028"},{"key":"ref11","doi-asserted-by":"publisher","DOI":"10.1109\/IPFA.2013.6599120"},{"key":"ref12","doi-asserted-by":"publisher","DOI":"10.1109\/DFT.2013.6653598"},{"key":"ref13","article-title":"Characterization and simulation of a body biased structure in triple-well technology under pulsed photoelectric laser stimulation","author":"borrel","year":"2014","journal-title":"Int Symp Testing and Failure Analysis (ISTFA)"},{"key":"ref14","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS.2015.7229849"},{"key":"ref15","doi-asserted-by":"publisher","DOI":"10.1109\/IRPS.2015.7112799"},{"key":"ref16","doi-asserted-by":"publisher","DOI":"10.1109\/IOLTS.2015.7229820"},{"key":"ref17","doi-asserted-by":"publisher","DOI":"10.1109\/TCAD.2015.2391773"},{"key":"ref18","article-title":"Electrical Modeling of the Effect of Photoelectric Laser Fault Injection on Bulk CMOS Design","author":"h\u00e9rivaux","year":"2013","journal-title":"Int Symp Testing and Failure Analysis (ISTFA)"},{"key":"ref4","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.1965.4323904"},{"key":"ref3","doi-asserted-by":"publisher","DOI":"10.1109\/TDMR.2005.853449"},{"key":"ref6","first-page":"2","article-title":"Optical fault induction attacks","author":"skorobogatov","year":"2002","journal-title":"4th International Workshop on Cryptographic Hardware and Embedded Systems ser CHES '02"},{"key":"ref5","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.2013.2255312"},{"key":"ref8","doi-asserted-by":"publisher","DOI":"10.1016\/j.microrel.2013.07.125"},{"key":"ref7","doi-asserted-by":"publisher","DOI":"10.1109\/JPROC.2012.2188769"},{"key":"ref2","doi-asserted-by":"publisher","DOI":"10.1109\/23.556861"},{"key":"ref1","doi-asserted-by":"publisher","DOI":"10.1109\/TNS.1975.4328188"},{"key":"ref9","doi-asserted-by":"publisher","DOI":"10.1109\/FDTC.2013.17"}],"event":{"name":"2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS)","start":{"date-parts":[[2015,10,12]]},"location":"Amherst, MA, USA","end":{"date-parts":[[2015,10,14]]}},"container-title":["2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS)"],"original-title":[],"link":[{"URL":"http:\/\/xplorestaging.ieee.org\/ielx7\/7304347\/7315124\/07315158.pdf?arnumber=7315158","content-type":"unspecified","content-version":"vor","intended-application":"similarity-checking"}],"deposited":{"date-parts":[[2017,3,25]],"date-time":"2017-03-25T02:18:15Z","timestamp":1490408295000},"score":1,"resource":{"primary":{"URL":"http:\/\/ieeexplore.ieee.org\/document\/7315158\/"}},"subtitle":[],"short-title":[],"issued":{"date-parts":[[2015,10]]},"references-count":18,"URL":"https:\/\/doi.org\/10.1109\/dft.2015.7315158","relation":{},"subject":[],"published":{"date-parts":[[2015,10]]}}}